| Magnetic and structural changes in the near-surface epitaxial Y2.95La0.05Fe5O12 films after high-dose ion implantation IM Fodchuk, II Gutsuliak, VV Dovganiuk, AO Kotsyubynskiy, U Pietsch, ... Applied Optics 55 (12), B144-B149, 2016 | 11 | 2016 |
| X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, SV Lizunova, ... physica status solidi (a) 208 (11), 2552-2557, 2011 | 7 | 2011 |
| Defect structure of high-resistivity CdTe: Cl crystals according to the data of high-resolution X-ray diffractometry I Fodchuk, A Kuzmin, I Hutsuliak, M Solodkyi, V Dovganyuk, ... Fourteenth International Conference on Correlation Optics 11369, 380-391, 2020 | 6 | 2020 |
| X-Ray diffractometry of lanthanum-doped iron-Yttrium garnet structures after ion implantation IM Fodchuk, VV Dovganiuk, II Gutsuliak, IP Yaremiy, AY Bonchyk, ... Metallofizika i Noveishie Tekhnologii 35 (9), 1209-1222, 2013 | 6 | 2013 |
| Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons EN Kislovskii, VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, ... Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2013 | 6 | 2013 |
| Determination of dominant type of defects in Cz-Si single crystals after irradiation with high-energy electrons. VV Dovganyuk, OG Gimchinsky, AV Oleinych-Lysyuk, AI Nizkova Semiconductor Physics, Quantum Electronics & Optoelectronics 9 (2), 2006 | 6 | 2006 |
| J. Surface Investigation. X-Ray, Synchrotron and Neutron Techniques, 7 EN Kislovskii, VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, ... | 5 | 2013 |
| Defect structure changes in the single Si-crystals after irradiation by high-energy electrons and long natural aging by high-resolution three-crystal X-ray diffractometry VV Dovganyuk, TV Lytvynchuk, VV Slobodyan, MI Fodchuk Eighth International Conference on Correlation Optics 7008, 370-376, 2008 | 4 | 2008 |
| Defect and magnetic structure of Y2. 93La0. 07Fe5O12/Gd3Ga5O12 epitaxial systems I Fodchuk, I Hutsuliak, V Dovganyuk, O Sumariuk, O Gudymenko, ... Fourteenth International Conference on Correlation Optics 11369, 368-379, 2020 | 3 | 2020 |
| Features of changes of characteristics of microdefects in Cz-Si monocrystals after an irradiation by high-energy electrons according to curves of diffraction reflection of X-rays VV Dovganyuk, IM Fodchuk, OG Gymchynsky, AV Oliynych-Lysyuk, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 28 (10), 1291-1307, 2006 | 2 | 2006 |
| X-ray investigations of structure of thick YIG epitaxial systems of different growth parameters I Fodchuk, I Hutsuliak, V Dovganyuk, A Kuzmin, Y Roman, M Solodkyi, ... Fifteenth International Conference on Correlation Optics 12126, 408-415, 2021 | 1 | 2021 |
| X-Ray Diffractometry of Transformations in Microdefect Structure of Silicon Crystals after High-Energy Electron Irradiation IM Fodchuk, TP Vladimirova, VV Dovganyuk, OV Reshetnyk, VP Klad'ko, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 32 (9), 1213-1229, 2010 | 1 | 2010 |
| Вплив опромінення високоенергетичними електронами на дефектну структуру монокристалів Cz-Si згідно високороздільної трикристальної Х-променевої дифрактометрії ІМ Фодчук, ВВ Довганюк, ВП Кладько, МВ Слободян, ТВ Литвинчук, ... Науковий вісник Чернівецького університету. Фізика, електроніка, 40-44, 2008 | 1 | 2008 |
| Investigation of the defect structure of high-resistance CdTe single crystals by the methods of high-resolution x-ray diffractometry and total integral reflective power I Fodchuk, A Kuzmin, V Dovganyuk, S Balovsyak, I Hutsuliak, M Solodkyi, ... Sixteenth International Conference on Correlation Optics 12938, 400-405, 2024 | | 2024 |
| Залежність магнітної доменної структури гранатових сполук від структурних параметрів ІМ Фодчук, ВВ Довганюк, ІІ Гуцуляк, АО Коцюбинський, ПМ Литвин, ... Науковий вісник Чернівецького університету. Фізика, електроніка, 39-45, 2014 | | 2014 |
| КОМБИНИРОВАННАЯ МНОГОПАРАМЕТРИЧЕСКАЯ РЕНТГЕНОДИФРАКЦИОННАЯ ДИАГНОСТИКА МИКРОДЕФЕКТОВ В КРИСТАЛЛАХ КРЕМНИЯ ПОСЛЕ ОБЛУЧЕНИЯ ВЫСОКОЭНЕРГЕТИЧЕСКИМИ ЭЛЕКТРОНАМИ ЕН Кисловский, ВБ Молодкин, СИ Олиховский, ЕГ Лень, ... Поверхность. Рентгеновские, синхротронные и нейтронные исследования, 25-25, 2013 | | 2013 |
| Рентгеновская дифрактометрия структуры легированных лантаном железо-иттриевых гранатов после ионной имплантации ИМ Фодчук, ВВ Довганюк, ИИ Гуцуляк, ИП Яремий, АА Бончик, ... Металлофизика и новейшие технологии, 1209-1222, 2013 | | 2013 |
| Transformations in Microdefect Structure of Cz-Si Single Crystals after Irradiation with High-Energy Electrons According to the Data of X-Ray Diffractometry VV Dovganyuk, VB Molodkin, VP Klad'ko, EM Kyslovskyi, TV Lytvynchuk, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 32 (8), 1049-1057, 2010 | | 2010 |
| Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry ІМ Fodchuk, VV Dovganyuk, ТV Litvinchuk, VP Kladko, МV Slobodian, ... Semiconductor Physics Quantum Electronics & Optoelectronics, 2010 | | 2010 |
| Interactions of radiation and particles: X-Ray diffractometry of transformations in microdefect structure of silicon crystals after high-energy electron irradiation IM Fodchuk, TP Vladimirova, VV Dovganyuk, OV Reshetnyk, VP Klad'Ko, ... Металлофизика и новейшие технологии 32 (9), 1213-1229, 2010 | | 2010 |
Igor FodchukYuriy Fedkovych Chernivtsi National UniversityПідтверджена електронна адреса в chnu.edu.ua
