Підписатись
Stanislav Shutov, С.В.Шутов, Станислав Шутов, Шутов С.В.
Stanislav Shutov, С.В.Шутов, Станислав Шутов, Шутов С.В.
Ph.D., Senior researcher Laboratory of materials technology for optoelectronics
Підтверджена електронна адреса в isp.kiev.ua - Домашня сторінка
Назва
Посилання
Посилання
Рік
Cadmium phosphide as a new material for infrared converters
D Stepanchikov, S Shutov
Semiconductor Physics Quantum Electronics & Optoelectronics, 2006
182006
Light scattering of water under magnetic field
VF Kovalenko, AY Bordyuk, SV Shutov
Ukrainian journal of physical optics, 6-20, 2010
132010
Investigation of the nature of light scattering by water
VF Kovalenko, PG Levchenko, SV Shutov, AY Bordiuk
Ukrainian journal of physical optics, 38-53, 2009
112009
High temperature operation limit assessment for 4H-SiC Schottky diode-based extreme temperature sensors
VA Krasnov, SV Shutov, SY Yerochin, OM Demenskyi
IEEE Sensors Journal 19 (5), 1640-1644, 2018
102018
Note: Determination of temperature dependence of GaP bandgap energy from diode temperature response characteristics
VA Krasnov, SV Shutov, YM Shwarts, SY Yerochin
Review of Scientific Instruments 82 (8), 2011
72011
The Cluster Nature of Water Scattering
VF Kovalenko, PG Levchenko, SV Shutov
Biomedical Radio Electronics 5, 36-45, 2008
72008
High temperature diode sensors based on InGaN/AlGaN structures
VA Krasnov, SV Shutov, SY Yerochin, AN Demenskiy
Journal of Vacuum Science & Technology B 36 (2), 2018
62018
Yu. Interferential Effects in Scattering of Biological Liquids
VF Kovalenko, SV Shutov, A Borduyk
Biomedical Radio Electronics 8, 71-78, 2009
52009
Effect of the charge carrier drift on emission spectrum of the graded band-gap semiconductors in the built-in quasi-electric field; Vliyanie drejfa nositelej zaryada vo …
AI Bazyk, VF Kovalenko, AY Mironchenko, SV Shutov
Fizika i Tekhnika Poluprovodnikov 35, 2001
52001
Operational estimate of the impurity concentration in the emitter in designing npn drift transistors
NA Samoilov, AN Frolov, SV Shutov
Technical Physics Letters 22 (4), 281-282, 1996
51996
LPE application technique for obtaining of thin film semiconductor compounds
V Tsybulenko, S Shutov, S Yerochin
Proceedings 2 (14), 1116, 2018
42018
Determination of ultimate output characteristics of wide bandgap recombination-mode diode temperature sensors
VA Krasnov, SV Shutov, YM Shwarts, SY Yerochin
Sensing and Imaging 18, 1-9, 2017
42017
Reducing the density of threading dislocations in GaAs epitaxial layers. Efficiency assessment of isovalent Bi doping and Pb doping
YE Baganov, V Krasnov, O Lebed, S Shutov
Materials Science-Poland 27 (2), 355-363, 2009
42009
Edge-photoluminescence concentration dependence in semi-insulating undoped GaAs
VF Kovalenko, MB Litvinova, SV Shutov
Semiconductors 36, 167-170, 2002
42002
Determination of the base thickness of a drift transistor by" punch-through" voltage.
IE Maronchuk, AN Frolov, SV Shutov
Radioelectronics and Communications Systems 44 (11), 46-49, 2001
42001
Effect of the charge-carrier drift in a built-in quasi-electric field on the emission spectrum of the graded-gap semiconductors
AI Bazyk, VF Kovalenko, AY Mironchenko, SV Shutov
Semiconductors 35, 54-58, 2001
42001
Temperature dependence of the lifetime of nonequilibrium charge carriers in GaP diodes under condition of recombination current domination
VA Krasnov, SV Shutov, SY Yerochin
Current Applied Physics 15 (4), 504-510, 2015
32015
Size effect in two-photon absorption of recombination radiation in graded-gap AlxGa1−x As solid solutions
VF Kovalenko, SV Shutov
Semiconductors 37, 38-43, 2003
32003
The effect of charge-carrier drift in the built-in quasi-electric field on the emission spectrum for graded-gap semiconductors
VF Kovalenko, AY Mironchenko, SV Shutov
Semiconductors 36, 185-188, 2002
32002
Enhancing parameters of silicon varactors using laser gettering
IM Vikulin, VN Litvinenko, SV Shutov, AI Maronchuk, AN Demenskiy, ...
Технология и конструирование в электронной аппаратуре, 2018
22018
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