Підписатись
Oleksandr Bonchyk
Oleksandr Bonchyk
Institute for Applied Problem of Mechanics and Mathematics
Підтверджена електронна адреса в iapmm.lviv.ua
Назва
Посилання
Посилання
Рік
Optical and electrical studies of arsenic–implanted HgCdTe films grown with molecular beam epitaxy on GaAs and Si substrates
II Izhnin, AV Voitsekhovsky, AG Korotaev, OI Fitsych, AY Bonchyk, ...
Infrared Physics & Technology 81, 52-58, 2017
312017
Inhomogeneous structure of near-surface layers in the ion-implanted NiTi alloy
T Czeppe, N Levintant-Zayonts, Z Swiatek, M Michalec, O Bonchyk, ...
Vacuum 83, S214-S219, 2009
262009
Arsenic-ion implantation-induced defects in HgCdTe films studied with Hall-effect measurements and mobility spectrum analysis
II Izhnin, KD Mynbaev, AV Voitsekhovsky, AG Korotaev, II Syvorotka, ...
Infrared Physics & Technology 98, 230-235, 2019
252019
Laser solid-phase doping of semiconductors
AM Prokhorov, AY Bonchik, SG Kiyak, AA Manenkov, GN Mikhailova, ...
Applied Surface Science 43 (1-4), 340-345, 1989
251989
Laser doping in Si, InP and GaAs
A Pokhmurska, O Bonchik, S Kiyak, G Savitski, A Gloskovsky
Applied surface science 154, 712-715, 2000
242000
Laser technology for submicron-doped layers formation in semiconductors
AY Bonchik, SG Kijak, Z Gotra, W Proszak
Optics & Laser Technology 33 (8), 589-591, 2001
172001
Hall-effect studies of modification of HgCdTe surface properties with ion implantation and thermal annealing
AG Korotaev, II Izhnin, KD Mynbaev, AV Voitsekhovskii, SN Nesmelov, ...
Surface and Coatings Technology 393, 125721, 2020
152020
The effect of built-in electric field on As diffusion in HgCdTe graded-band-gap epitaxial layers
AP Vlasov, BS Sokolovskii, LS Monastyrskii, OY Bonchyk, A Barcz
Thin Solid Films 459 (1-2), 28-31, 2004
152004
Nano-size defects in arsenic-implanted HgCdTe films: a HRTEM study
OY Bonchyk, HV Savytskyy, Z Swiatek, Y Morgiel, II Izhnin, ...
Applied Nanoscience 9, 725-730, 2019
132019
Electrical and microscopic characterization of p+-type layers formed in HgCdTe by arsenic implantation
II Izhnin, KD Mynbaev, AV Voitsekhovskii, SN Nesmelov, SM Dzyadukh, ...
Semiconductor Science and Technology 35 (11), 115019, 2020
112020
Controlled arsenic diffusion in epitaxial CdxHg1− xTe layers in the evaporation–condensation–diffusion process
A Vlasov, V Pysarevsky, O Storchun, A Shevchenko, A Bonchyk, ...
Thin Solid Films 403, 144-147, 2002
112002
Magnetic and structural changes in the near-surface epitaxial Y2.95La0.05Fe5O12 films after high-dose ion implantation
IM Fodchuk, II Gutsuliak, VV Dovganiuk, AO Kotsyubynskiy, U Pietsch, ...
Applied Optics 55 (12), B144-B149, 2016
102016
High temperature arsenic doping of CdHgTe epitaxial layers
A Vlasov, V Bogoboyashchyy, O Bonchyk, A Barcz
Crystal Research and Technology: Journal of Experimental and Industrial …, 2004
102004
Structural evolution of near-surface layers in NiTi alloy caused by an ion implantation
Z Świątek, M Michalec, N Levintant-Zayonts, J Bonarski, A Budziak, ...
Acta Physica Polonica. A 120 (1), 2011
92011
Defects in Arsenic Implanted р+–n- and n+–p- Structures Based on MBE Grown CdHgTe Films
II Izhnin, EI Fitsych, AV Voitsekhovskii, AG Korotaev, KD Mynbaev, ...
Russian Physics Journal 60, 1752-1757, 2018
72018
Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions
IM Fodchuk, II Gutsuliak, RA Zaplitniy, SV Balovsyak, IP Yaremiy, ...
Semiconductor Physics Quantum Electronics & Optoelectronics, 2013
72013
Nano-size defect layers in arsenic-implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy
OY Bonchyk, HV Savytskyy, II Izhnin, KD Mynbaev, II Syvorotka, ...
Applied Nanoscience 10, 4971-4976, 2020
62020
Direct comparison of the results of arsenic ion implantation in n–and p–type Hg0. 8Cd0. 2Te
II Izhnin, KD Mynbaev, Z Swiatek, J Morgiel, AV Voitsekhovskii, ...
Infrared Physics & Technology 109, 103388, 2020
62020
TEM studies of structural defects in HgTe/HgCdTe quantum wells
OY Bonchyk, HV Savytskyy, Z Swiatek, Y Morgiel, II Izhnin, ...
Applied Nanoscience 10, 2867-2871, 2020
62020
X-Ray diffractometry of lanthanum-doped iron-Yttrium garnet structures after ion implantation
IM Fodchuk, VV Dovganiuk, II Gutsuliak, IP Yaremiy, AY Bonchyk, ...
Metallofizika i Noveishie Tekhnologii 35 (9), 1209-1222, 2013
62013
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