Serge Demidenko
Serge Demidenko
Dean, School of Science and Technology, Sunway University, MY
Verified email at IEEE.org
Title
Cited by
Cited by
Year
Generation and application of pseudorandom sequences for random testing
VN Yarmolik, SN Demidenko
Wiley, 1988
891988
Masterslave control of a teleoperated anthropomorphic robotic arm with gripping force sensing
GS Gupta, SC Mukhopadhyay, CH Messom, SN Demidenko
IEEE Transactions on Instrumentation and Measurement 55 (6), 2136-2145, 2006
862006
A low-cost sensing system for quality monitoring of dairy products
SC Mukhopadhyay, CP Gooneratne, GS Gupta, SN Demidenko
IEEE Transactions on Instrumentation and Measurement 55 (4), 1331-1338, 2006
822006
Saxophone reed inspection employing planar electromagnetic sensors
SC Mukhopadhyay, GS Gupta, JD Woolley, SN Demidenko
IEEE Transactions on Instrumentation and Measurement 56 (6), 2492-2503, 2007
492007
,
, 1986
47*1986
Wireless sensor network for selective activity monitoring in a home for the elderly
GS Gupta, SC Mukhopadhyay, M Sutherland, S Demidenko
2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 1-6, 2007
462007
Real-time identification and predictive control of fast mobile robots using global vision sensing
GS Gupta, CH Messom, S Demidenko
IEEE Transactions on Instrumentation and Measurement 54 (1), 200-214, 2005
422005
Reducing burn-in time through high-voltage stress test and Weibull statistical analysis
MF Zakaria, ZA Kassim, MPL Ooi, S Demidenko
IEEE Design & Test of computers 23 (2), 88-98, 2006
402006
Multivariate alternating decision trees
HK Sok, MPL Ooi, YC Kuang, S Demidenko
Pattern Recognition 50, 195-209, 2016
372016
Size/position identification in real-time image processing using run length encoding
CH Messom, S Demidenko, K Subramaniam, GS Gupta
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement, 2002
362002
March PS (23N) test for DRAM pattern-sensitive faults
V Yarmolik, Y Klimets, S Demidenko
Test Symposium, 1998. ATS'98. Proceedings. Seventh Asian, 354-357, 1998
331998
RAM diagnostic tests
VN Yarmolik, YV Klimets, AJ Van De Goor, SN Demidenko
Memory Technology, Design and Testing, 100-102, 1996
331996
Gaussian process dynamical models for hand gesture interpretation in sign language
N Gamage, YC Kuang, R Akmeliawati, S Demidenko
Pattern Recognition Letters 32 (15), 2009-2014, 2011
322011
Defect cluster recognition system for fabricated semiconductor wafers
MPL Ooi, HK Sok, YC Kuang, S Demidenko, C Chan
Engineering Applications of Artificial Intelligence 26 (3), 1029-1043, 2013
302013
Shortening burn-in test: Application of HVST and Weibull statistical analysis
MPL Ooi, ZA Kassim, SN Demidenko
IEEE Transactions on instrumentation and measurement 56 (3), 990-999, 2007
282007
Hough transform run length encoding for real-time image processing
CH Messom, GS Gupta, SN Demidenko
IEEE transactions on instrumentation and measurement 56 (3), 962-967, 2007
282007
Defect analysis of grit-blasted or spray printed surface using vision sensing technique
G Sengupta, TA Win, C Messom, S Demidenko, SC Mukhopadhyay
Proceedings of Image and Vision Computing NZ, 18-23, 2003
26*2003
Improving predictive control of a mobile robot: Application of image processing and kalman filtering
CH Messom, GS Gupta, S Demidenko, LY Siong
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No, 2003
262003
Low cost sensing system for dairy products quality monitoring
SC Mukhopadhyay, CP Gooneratne, S Demidenko, GS Gupta
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings 1, 2005
252005
Getting more from the semiconductor test: Data mining with defect-cluster extraction
MPL Ooi, EKJ Joo, YC Kuang, S Demidenko, L Kleeman, CWK Chan
IEEE Transactions on Instrumentation and Measurement 60 (10), 3300-3317, 2011
242011
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