| Study and handling methods of power IGBT module failures in power electronic converter systems UM Choi, F Blaabjerg, KB Lee IEEE Transactions on Power Electronics 30 (5), 2517-2533, 2014 | 617 | 2014 |
| Reliability improvement of a T-type three-level inverter with fault-tolerant control strategy UM Choi, F Blaabjerg, KB Lee IEEE Transactions on Power Electronics 30 (5), 2660-2673, 2014 | 268 | 2014 |
| Method for detecting an open-switch fault in a grid-connected NPC inverter system UM Choi, HG Jeong, KB Lee, F Blaabjerg IEEE Transactions on Power Electronics 27 (6), 2726-2739, 2011 | 263 | 2011 |
| Diagnosis and tolerant strategy of an open-switch fault for T-type three-level inverter systems UM Choi, KB Lee, F Blaabjerg IEEE Transactions on Industry Applications 50 (1), 495-508, 2013 | 259 | 2013 |
| Open-circuit fault diagnosis and fault-tolerant control for a grid-connected NPC inverter UM Choi, JS Lee, F Blaabjerg, KB Lee IEEE Transactions on Power Electronics 31 (10), 7234-7247, 2015 | 219 | 2015 |
| Power cycling test methods for reliability assessment of power device modules in respect to temperature stress UM Choi, F Blaabjerg, S Jørgensen IEEE Transactions on Power Electronics 33 (3), 2531-2551, 2017 | 214 | 2017 |
| Advanced Accelerated Power Cycling Test for Reliability Investigation of Power Device Modules UM Choi, S Joergensen, F Blaabjerg IEEE Transactions on Power Electronics 31 (12), 8371 - 8386, 2016 | 178 | 2016 |
| New modulation strategy to balance the neutral-point voltage for three-level neutral-clamped inverter systems UM Choi, JS Lee, KB Lee IEEE Transactions on Energy Conversion 29 (1), 91-100, 2014 | 177 | 2014 |
| Simple neutral-point voltage control for three-level inverters using a discontinuous pulse width modulation UM Choi, HH Lee, KB Lee IEEE Transactions on Energy Conversion 28 (2), 434-443, 2013 | 175 | 2013 |
| Reliability improvement of power converters by means of condition monitoring of IGBT modules UM Choi, F Blaabjerg, S Jørgensen, S Munk-Nielsen, B Rannestad IEEE Transactions on Power Electronics 32 (10), 7990-7997, 2016 | 172 | 2016 |
| Study on Effect of Junction Temperature Swing Duration on Lifetime of Transfer Molded Power IGBT Modules UM Choi, F Blaabjerg, S Jørgensen IEEE Transactions on Power Electronics 32 (8), 6434-6443, 2017 | 92 | 2017 |
| Control strategy of two capacitor voltages for separate MPPTs in photovoltaic systems using neutral-point-clamped inverters UM Choi, F Blaabjerg, KB Lee IEEE Transactions on Industry Applications 51 (4), 3295-3303, 2015 | 89 | 2015 |
| Validation of lifetime prediction of IGBT modules based on linear damage accumulation by means of superimposed power cycling tests UM Choi, K Ma, F Blaabjerg IEEE Transactions on Industrial Electronics 65 (4), 3520-3529, 2017 | 81 | 2017 |
| Method to minimize the low-frequency neutral-point voltage oscillations with time-offset injection for neutral-point-clamped inverters UM Choi, F Blaabjerg, KB Lee IEEE Transactions on Industry Applications 51 (2), 1678-1691, 2014 | 72 | 2014 |
| Junction temperature estimation method for a 600 V, 30A IGBT module during converter operation UM Choi, F Blaabjerg, F Iannuzzo, S Jørgensen Microelectronics Reliability 55 (9-10), 2022-2026, 2015 | 68 | 2015 |
| Separation of wear-out failure modes of IGBT modules in grid-connected inverter systems UM Choi, F Blaabjerg IEEE Transactions on Power Electronics 33 (7), 6217-6223, 2017 | 66 | 2017 |
| Space vector modulation strategy for neutral‐point voltage balancing in three‐level inverter systems UM Choi, KB Lee IET Power Electronics 6 (7), 1390-1398, 2013 | 66 | 2013 |
| Comparison of tolerance controls for open-switch fault in a grid-connected T-type rectifier JS Lee, UM Choi, KB Lee IEEE Transactions on Power Electronics 30 (10), 5810-5820, 2014 | 59 | 2014 |
| Prediction and validation of wear-out reliability metrics for power semiconductor devices with mission profiles in motor drive application K Ma, UM Choi, F Blaabjerg IEEE Transactions on Power Electronics 33 (11), 9843-9853, 2018 | 58 | 2018 |
| Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations UM Choi, F Blaabjerg, S Jørgensen, F Iannuzzo, H Wang, C Uhrenfeldt, ... Microelectronics Reliability 64, 403-408, 2016 | 55 | 2016 |
Frede BlaabjergProfessor in Power Electronics, Villum Investigator, Aalborg University, DenmarkПодтвержден адрес электронной почты в домене et.aau.dk
