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Kyunghwan Kim
Kyunghwan Kim
Seoul National University, Department of Electrical and Computer Engineering
Подтвержден адрес электронной почты в домене snu.ac.kr - Главная страница
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High-resolution patterning of colloidal quantum dots via non-destructive, light-driven ligand crosslinking
J Yang, D Hahm, K Kim, S Rhee, M Lee, S Kim, JH Chang, HW Park, ...
Nature communications 11 (1), 2874, 2020
1462020
A bioinspired stretchable sensory‐neuromorphic system
SH Kim, GW Baek, J Yoon, S Seo, J Park, D Hahm, JH Chang, D Seong, ...
Advanced Materials 33 (44), 2104690, 2021
742021
Highly efficient and bright inverted top‐emitting InP quantum dot light‐emitting diodes introducing a hole‐suppressing interlayer
T Lee, D Hahm, K Kim, WK Bae, C Lee, J Kwak
Small 15 (50), 1905162, 2019
632019
Recent progress in high-luminance quantum dot light-emitting diodes
S Rhee, K Kim, J Roh, J Kwak
Current Optics and Photonics 4 (3), 161-173, 2020
352020
“Positive incentive” approach to enhance the operational stability of quantum dot-based light-emitting diodes
S Rhee, JH Chang, D Hahm, K Kim, BG Jeong, HJ Lee, J Lim, K Char, ...
ACS applied materials & interfaces 11 (43), 40252-40259, 2019
232019
Analysis of Interfacial Layer-Induced Open-Circuit Voltage Burn-In Loss in Polymer Solar Cells on the Basis of Electroluminescence and Impedance Spectroscopy
J Kim, H Jung, J Song, K Kim, C Lee
ACS applied materials & interfaces 9 (28), 24052-24060, 2017
112017
Optimum Design Configuration of Thin‐Film Transistors and Quantum‐Dot Light‐Emitting Diodes for Active‐Matrix Displays
GW Baek, SG Seo, D Hahm, YJ Kim, K Kim, T Lee, J Kim, WK Bae, SH Jin, ...
Advanced Materials 35 (48), 2304717, 2023
42023
Effect of excess carriers on the degradation of InP-based quantum-dot light-emitting diodes
K Kim, D Hahm, GW Baek, T Lee, D Shin, J Lim, WK Bae, J Kwak
ACS Applied Electronic Materials 4 (12), 6229-6236, 2022
42022
P‐115: Effect of Solvents and Pressure on the Performance of Quantum Dot light Emitting Diodes Fabricated with Soft‐Contact Transfer Printing
K Kim, H Jung, WK Bae, C Lee
SID Symposium Digest of Technical Papers 49 (1), 1643-1646, 2018
42018
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