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Антон Михайлов, Mikhailov AI (ORCID:0000-0001-8058-2183)
Антон Михайлов, Mikhailov AI (ORCID:0000-0001-8058-2183)
National Technical University “Kharkiv Polytechnic Institute”. UKRAINE
Підтверджена електронна адреса в kpi.kharkov.ua
Назва
Посилання
Посилання
Рік
Perspectives of development of X-ray analysis for material composition
IF Mikhailov, AA Baturin, AI Mikhailov, LP Fomina
Functional materials, 2016
272016
Determination of coal ash content by the combined x-ray fluorescence and scattering spectrum
IF Mikhailov, AA Baturin, AI Mikhailov, SS Borisova, LP Fomina
Review of scientific instruments 89 (2), 2018
172018
Contrast enhancement of X-ray fluorescence spectra using the secondary two-layer radiator
IF Mikhailov, AA Baturin, AI Mikhailov, SS Borisova
Functional materials, 2011
112011
Dependence of the Compton to Rayleigh intensity ratio on the scatterer atomic number in the range of 4 (Be) to 31 (Ga)
IF Mikhailov, AA Baturin, AI Mikhailov, SS Borisova, SV Surovitskiy
X‐Ray Spectrometry 49 (2), 284-290, 2020
102020
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
IF Mikhailov, AA Baturin, AI Mikhailov, SS Borisova
Functional materials, 2012
92012
Рентгеновские методы анализа состава материалов
ИФ Михайлов, АА Батурин, АИ Михайлов
Харків: Підручник НТУ ХПІ, 2015. 204 с, 2015
72015
Рентгеновские методы анализа состава материалов
ИФ Михайлов, АА Батурин, АИ Михайлов
Харків: Підручник НТУ ХПІ, 2015. 204 с, 2015
72015
Detection limits of impurities in a light filler in an X-ray fluorescent arrangement with a secondary target
IF Mikhailov, AA Baturin, AI Mikhailov, LP Fomina
Instruments and Experimental Techniques 55, 490-493, 2012
72012
Method for the identification of substances by the ratio of the intensity of coherent to incoherent scattering
IF Mikhailov, AI Mikhailov, AA Baturin, LP Fomina
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2020
62020
Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra
AI Mikhailov, IF Mikhailov, AA Baturin
Cambridge Scholars Publishing, 2019
52019
Rapid diagnostics of urinary iodine using a portable EDXRF spectrometer
IF Mikhailov, AA Baturin, AI Mikhailov, SS Borisova, MV Reshetnyak, ...
Journal of X-Ray Science and Technology 25 (3), 515-521, 2017
42017
Light element depth distribution by the intensity ratio of incoherent and coherent scattering
IF Mikhailov, AA Baturin, AI Mikhailov, SA Knyazev
X‐Ray Spectrometry 48 (6), 604-610, 2019
32019
Optimization for the range of analytical line intensity measurement in energy-dispersion x-ray fluorescent analysis
AA Mamaluy, AI Mikhailov, LP Fomina
Национальный научный центр" Харьковский физико-технический институт", 2015
32015
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector
IF Mikhailov, AA Baturin, LP Fomina
Functional materials, 2010
32010
Determination of the screening parameter for 1s electrons in a bound atom by the ratio of the intensities of coherent and incoherent scattering of X‐rays
IF Mikhailov, SV Surovitskiy, AI Mikhailov
X‐Ray Spectrometry 50 (3), 231-238, 2021
22021
Determination of binary systems based on light elements by the ratio of the Compton and Rayleigh scattering intensities
IF Mikhailov, AA Baturin, AI Mikhailov, SS Borisova
X‐Ray Spectrometry 49 (5), 554-559, 2020
22020
X-ray method for determination of mineral constituent in solid fuel
IF Mikhailov, AA Baturin, AI Mikhailov
Functional materials, 2014
22014
Quantitative estimation of impurities in the nanosized mass range in the X-ray fluorescence arrangement with a secondary target
IF Mikhailov, AA Baturin, AI Mikhailov, EA Bugaev
Instruments and Experimental Techniques 56, 84-86, 2013
22013
Источник монохроматического рентгеновского излучения на основе двухступенчатого вторичного излучателя
АА Мамалуй, АА Батурин, АИ Михайлов
Вопросы атомной науки и техники, 2012
22012
Determination of the figurative point trajectory on the phase diagram of NiO lithiation–oxidation process by x-ray diffraction and Compton scattering methods
IF Mikhailov, S Gabielkov, AI Mikhailov, S Surovitskiy
Review of Scientific Instruments 93 (8), 2022
12022
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