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Olikh Oleg
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Review and test of methods for determination of the Schottky diode parameters
OY Olikh
Journal of Applied Physics 118 (2), 2015
382015
Ultrasound-stimulated increase in the electron diffusion length in p-Si crystals
OY Olikh, IV Ostrovskii
Physics of the Solid State 44, 1249-1253, 2002
222002
Ultrasonically Recovered Performance of-Irradiated Metal-Silicon Structures
AM Gorb, OA Korotchenkov, OY Olikh, AO Podolian
IEEE Transactions on Nuclear Science 57 (3), 1632-1639, 2010
162010
On the mechanism of ultrasonic loading effect in silicon-based Schottky diodes
O Olikh, K Voytenko
Ultrasonics 66, 1-3, 2016
132016
Ultrasound influence on I–V–T characteristics of silicon Schottky barrier structure
OY Olikh, KV Voytenko, RM Burbelo
Journal of Applied Physics 117 (4), 2015
132015
Увеличение длины диффузии электронов в кристаллах p-кремния под действием ультразвука
ОЯ Олих, ИВ Островский
Физика твердого тела 44 (7), 1198, 2002
132002
Reversible influence of ultrasound on γ-irradiated Mo/n-Si Schottky barrier structure
OY Olikh
Ultrasonics 56, 545-550, 2015
122015
Features of dynamic acoustically induced modification of photovoltaic parameters of silicon solar cells
OY Olikh
Semiconductors 45, 798-804, 2011
112011
Increase of electron diffusion length in p-Si crystals under ultrasound action
OY Olikh, IV Ostrovsky
Fizika tverdogo tela 44 (7), 1198-1202, 2002
102002
Acoustically driven optical phenomena in bulk and low-dimensional semiconductors
IV Ostrovskii, OA Korotchenkov, OY Olikh, AA Podolyan, RG Chupryna, ...
Journal of Optics A: Pure and Applied Optics 3 (4), S82, 2001
102001
Acousto–defect interaction in irradiated and non-irradiated silicon n+–p structures
OY Olikh, AM Gorb, RG Chupryna, OV Pristay-Fenenkov
Journal of Applied Physics 123 (16), 2018
92018
Active ultrasound effects and their future usage in sensor electronics
JM Olikh, OY Olikh
Сенсорна електроніка і мікросистемні технології 1 (1), 19-29, 2004
92004
Non-Monotonic-Ray Influence on Mo/n-Si Schottky Barrier Structure Properties
OY Olikh
IEEE Transactions on Nuclear Science 60 (1), 394-401, 2013
82013
Ultrasonic assisted nanomanipulations with atomic force microscope
PM Lytvyn, OY Olikh, OS Lytvyn, OM Dyachyns' ka, IV Prokopenko
Semiconductor physics, quantum electronics & optoelectronics, 36-42, 2010
82010
Acoustic wave corrected current-voltage characteristics of GaAs-based structures with Schottky contacts
OY Olikh, TN Pinchuk
Technical physics letters 32, 517-519, 2006
82006
Clusters of Point Defects Near Dislocations as a Tool to Control CdZnTe Electrical Parameters by Ultrasound
YM Olikh, MD Tymochko, OY Olikh, VA Shenderovsky
Journal of Electronic Materials 47, 4370-4378, 2018
62018
особенности динамических акустоиндуцированных изменений фотоэлектрических параметров кремниевых солнечных элементов
ОЯ Олих
Физика и техника полупроводников 45 (6), 816-822, 2011
62011
The variation in activity of recombination centers in silicon p-n structures under the conditions of acoustic loading
OY Olikh
Semiconductors 43, 745-750, 2009
62009
Acoustically driven degradation in single crystalline silicon solar cell
OY Olikh
Superlattices and Microstructures 117, 173-188, 2018
52018
Characterization of interface deep levels in as vapor grown epi-GaAs
IV Ostrovskii, OY Olikh
Solid state communications 107 (7), 341-343, 1998
51998
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Статьи 1–20