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Mattia Carletti
Mattia Carletti
Scripps Research Translational Institute
Verified email at scripps.edu
Title
Cited by
Cited by
Year
Explainable machine learning in industry 4.0: Evaluating feature importance in anomaly detection to enable root cause analysis
M Carletti, C Masiero, A Beghi, GA Susto
2019 IEEE international conference on systems, man and cybernetics (SMC), 21-26, 2019
892019
Interpretable Anomaly Detection with DIFFI: Depth-based feature importance of Isolation Forest
M Carletti, M Terzi, GA Susto
Engineering Applications of Artificial Intelligence 119, 105730, 2023
65*2023
A deep learning approach for anomaly detection with industrial time series data: a refrigerators manufacturing case study
M Carletti, C Masiero, A Beghi, GA Susto
Procedia Manufacturing 38, 233-240, 2019
262019
Optimizing microbiota profiles for athletes
L Mancin, I Rollo, JF Mota, F Piccini, M Carletti, GA Susto, G Valle, A Paoli
Exercise and Sport Sciences Reviews 49 (1), 42-49, 2021
192021
A random forest-based approach for hand gesture recognition with wireless wearable motion capture sensors
N Bargellesi, M Carletti, A Cenedese, GA Susto, M Terzi
IFAC-PapersOnLine 52 (11), 128-133, 2019
162019
Algorithmic audit of italian car insurance: Evidence of unfairness in access and pricing
A Fabris, A Mishler, S Gottardi, M Carletti, M Daicampi, GA Susto, ...
Proceedings of the 2021 AAAI/ACM Conference on AI, Ethics, and Society, 458-468, 2021
152021
AcME—Accelerated model-agnostic explanations: Fast whitening of the machine-learning black box
D Dandolo, C Masiero, M Carletti, D Dalle Pezze, GA Susto
Expert Systems with Applications 214, 119115, 2023
132023
DBAM: Making virtual metrology/soft sensing with time series data scalable through deep learning
N Gentner, M Carletti, A Kyek, GA Susto, Y Yang
Control Engineering Practice 116, 104914, 2021
132021
Exploiting 2D coordinates as bayesian priors for deep learning defect classification of SEM images
S Arena, Y Bodrov, M Carletti, N Gentner, M Maggipinto, Y Yang, A Beghi, ...
IEEE Transactions on Semiconductor Manufacturing 34 (3), 436-439, 2021
62021
Enhancing scalability of virtual metrology: A deep learning-based approach for domain adaptation
N Gentner, A Kyek, Y Yang, M Carletti, GA Susto
2020 Winter Simulation Conference (WSC), 1898-1909, 2020
62020
Interpretable anomaly detection for knowledge discovery in semiconductor manufacturing
M Carletti, M Maggipinto, A Beghi, GA Susto, N Gentner, Y Yang, A Kyek
2020 Winter Simulation Conference (WSC), 1875-1885, 2020
32020
2021 Index IEEE Transactions on Semiconductor Manufacturing Vol. 34
C Akbar, M Arai, S Arena, K Arima, L Bai, S Barai, BM Basol, A Beghi, ...
IEEE Transactions on Semiconductor Manufacturing 34 (4), 2021
12021
Trustworthy Machine Learning for Anomaly Detection and Computer Vision Applications
M Carletti
Università degli studi di Padova, 2023
2023
On the Properties of Adversarially-Trained CNNs
M Carletti, M Terzi, GA Susto
arXiv preprint arXiv:2203.09243, 2022
2022
Improving Robustness with Image Filtering
M Terzi, M Carletti, GA Susto
arXiv preprint arXiv:2112.11235, 2021
2021
Interpretable anomaly detection with diffi: Depth-based isolation forest feature importance
M Carletti, M Terzi, GA Susto
arXiv preprint arXiv:2007.11117, 2020
2020
Optimizing Microbiota Profiles for Athletes: Dream or Reality?
L Mancin, I Rollo, JF Mota, F Piccini, M Carletti, GA Susto, G Valle, A Paoli
Exercise and Sport Sciences Reviews, 2020
2020
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