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Cited by
Year
Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in silicon
VB Molodkin, SI Olikhovskii, EG Len, EN Kislovskii, VP Kladko, ...
physica status solidi (a) 206 (8), 1761-1765, 2009
162009
Phys. Status Solidi A, 204
VB Molodkin, SI Olikhovskii, EN Kislovskii, IM Fodchuk, ES Skakunova, ...
Iss 8, 2606, 2007
152007
phys. status solidi (a), 204
AP Shpak, VB Molodkin, SI Olikhovskii, YM Kyslovskyy, OV Reshetnyk, ...
92007
Combined double‐and triple‐crystal X‐ray diffractometry with account for real defect structures in all crystals of X‐ray optical schemes
AP Shpak, VB Molodkin, SI Olikhovskii, YM Kyslovskyy, OV Reshetnyk, ...
physica status solidi (a) 204 (8), 2651-2656, 2007
72007
Theoretical and experimental principles of the differential-integral triple-crystal X-ray diffractometry of imperfect single crystals
VB Molodkin, VV Nemoshkalenko, SI Olikhovskii, EN Kislovskii, ...
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 20 (11), 29-40, 1998
71998
X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation
VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, SV Lizunova, ...
physica status solidi (a) 208 (11), 2552-2557, 2011
62011
Dynamical diffractometry of structural defects and strains in Y3Fe5O12/Gd3Ga5O12 garnet film system
VM Pylypiv, SJ Olikhovskyy, TP Vladimirova, OS Skakunova, VB Molodkin, ...
33 (9), 1147-1174, 2011
52011
The role of defects in the crystal bulk and strains in disturbed surface layers in three single crystals at the formation of triple-crystal profiles of X-ray difractometry
SI Olikhovskii, VB Molodkin, EN Kislovskii, OV Reshetnyk, TP Vladimirova, ...
Metallofizika Noveishie Tekhnol 27, 947-968, 2005
52005
Differential X-ray diffraction characterization of the complex defect structure in silicon single crystals
SJ Olikhovs' ky, YM Kislovs' ky, VB Molodkin, YG Len, TP Vladimirova, ...
Metallofizika i Noveishie Tekhnologii 22 (6), 3-19, 2000
52000
Dynamical Diffractometry of Structural Defects and Strains in Ion-Implanted Y3Fe5O12/Gd3Ga5O12/Y3Fe5O12 Garnet System
VM Pylypiv, OS Skakunova, TP Vladimirova, YM Kyslovs' kyy, ...
Metallofizika i Noveishie Tekhnologii 34 (11), 1451-1463, 2012
42012
Dynamical X‐ray diffractometry of the defect structure of garnet crystals
VM Pylypiv, TP Vladimirova, IM Fodchuk, BK Ostafiychuk, YM Kyslovskyy, ...
physica status solidi (a) 208 (11), 2558-2562, 2011
42011
Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures
SI Olikhovskii, VB Molodkin, OS Skakunova, EG Len, YM Kyslovskyy, ...
physica status solidi (b) 254 (7), 1600689, 2017
32017
Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons
EN Kislovskii, VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, ...
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2013
32013
Diffraction characterization of microdefect structure of silicon crystals after isochronal annealing
VB Molodkin, VP Klad'ko, SJ Olikhovs' kii, EM Kislovskiy, TP Vladimirova, ...
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 31 (9), 1205-1222, 2009
32009
Dynamical theory of triple-crystal X-ray diffractometry and characterization of microdefects and strains in imperfect single crystals
VB Molodkin, SI Olikhovskii, EG Len, YM Kyslovskyy, OV Reshetnyk, ...
, 2016
22016
Principles of Dynamical Diffractometry of Inhomogeneously Distributed Macrostrains and Microdefects in Implanted Multilayer Garnet Systems
OS Skakunova, VM Pylypiv, SJ Olikhovskii, TP Vladimirova, ...
34 (10), 1325-1346, 2012
22012
X-Ray Diffraction Characterization of Nanoscale Strains and Defects in Yttrium Iron Garnet Films Implanted with Fluorine Ions
SI Olikhovskii, OS Skakunova, VB Molodkin, VV Lizunov, YM Kyslovskyy, ...
Sumy State University, 2014
12014
Dynamical Diffractometry of Defects and Strains in Gd3Ga5O12 Garnet Crystals After Implantation with F+ Ions
OS Skakunova, VM Pylypiv, TP Vladimirova, SI Olikhovskii, VB Molodkin, ...
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 35 (12), 1595-1608, 2013
12013
X-Ray Diffractometry of Transformations in Microdefect Structure of Silicon Crystals after High-Energy Electron Irradiation
IM Fodchuk, TP Vladimirova, VV Dovganyuk, OV Reshetnyk, VP Klad'ko, ...
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 32 (9), 1213-1229, 2010
12010
High-resolution X-ray diffraction investigations of silicon grown by the float-zone method
VB Molodkin, M Ando, EN Kislovskii, SI Olikhovskii, TP Vladimirova, ...
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 24 (4), 541-552, 2002
12002
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