| Phys. Status Solidi A, 204 VB Molodkin, SI Olikhovskii, EN Kislovskii, IM Fodchuk, ES Skakunova, ... Iss 8, 2606, 2007 | 19* | 2007 |
| Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in silicon VB Molodkin, SI Olikhovskii, EG Len, EN Kislovskii, VP Kladko, ... physica status solidi (a) 206 (8), 1761-1765, 2009 | 17 | 2009 |
| Phys. Status Solidi A, 204 AP Shpak, VB Molodkin, SI Olikhovskii, YM Kyslovskyy, OV Reshetnyk, ... | 10 | 2007 |
| Dynamical X‐ray diffractometry of the defect structure of garnet crystals VM Pylypiv, TP Vladimirova, IM Fodchuk, BK Ostafiychuk, YM Kyslovskyy, ... physica status solidi (a) 208 (11), 2558-2562, 2011 | 8 | 2011 |
| Combined double‐and triple‐crystal X‐ray diffractometry with account for real defect structures in all crystals of X‐ray optical schemes AP Shpak, VB Molodkin, SI Olikhovskii, YM Kyslovskyy, OV Reshetnyk, ... physica status solidi (a) 204 (8), 2651-2656, 2007 | 8 | 2007 |
| Theoretical and experimental principles of the differential-integral triple-crystal X-ray diffractometry of imperfect single crystals VB Molodkin, VV Nemoshkalenko, SI Olikhovskii, EN Kislovskii, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 20 (11), 29-40, 1998 | 8 | 1998 |
| X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, SV Lizunova, ... physica status solidi (a) 208 (11), 2552-2557, 2011 | 7 | 2011 |
| Dynamical diffractometry of structural defects and strains in Y3Fe5O12/Gd3Ga5O12 garnet film system VM Pylypiv, SJ Olikhovskyy, TP Vladimirova, OS Skakunova, VB Molodkin, ... Металлофизика и новейшие технологии 33 (9), 1147-1174, 2011 | 7 | 2011 |
| Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons EN Kislovskii, VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, ... Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2013 | 6 | 2013 |
| The role of defects in the crystal bulk and strains in disturbed surface layers in three single crystals at the formation of triple-crystal profiles of X-ray difractometry SI Olikhovskii, VB Molodkin, EN Kislovskii, OV Reshetnyk, TP Vladimirova, ... Metallofizika Noveishie Tekhnol 27, 947-968, 2005 | 5 | 2005 |
| Differential X-ray diffraction characterization of the complex defect structure in silicon single crystals SJ Olikhovs' ky, YM Kislovs' ky, VB Molodkin, YG Len, TP Vladimirova, ... Metallofizika i Noveishie Tekhnologii 22 (6), 3-19, 2000 | 5 | 2000 |
| Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures SI Olikhovskii, VB Molodkin, OS Skakunova, EG Len, YM Kyslovskyy, ... physica status solidi (b) 254 (7), 1600689, 2017 | 4 | 2017 |
| Dynamical theory of triple-crystal X-ray diffractometry and characterization of microdefects and strains in imperfect single crystals VB Molodkin, SI Olikhovskii, EG Len, YM Kyslovskyy, OV Reshetnyk, ... Металлофизика и новейшие технологии, 2016 | 4 | 2016 |
| Dynamical Diffractometry of Structural Defects and Strains in Ion-Implanted Y3Fe5O12/Gd3Ga5O12/Y3Fe5O12 Garnet System VM Pylypiv, OS Skakunova, TP Vladimirova, YM Kyslovs' kyy, ... Metallofizika i Noveishie Tekhnologii 34 (11), 1451-1463, 2012 | 4 | 2012 |
| Semiconductor Physics, Quantum Electronics and Optoelectronics, 13 VB Molodkin, SI Olikhovskii, YM Kyslovskyy, EG Len, OV Reshetnyk, ... | 4 | 2010 |
| Diffraction characterization of microdefect structure of silicon crystals after isochronal annealing VB Molodkin, VP Klad'ko, SJ Olikhovs' kii, EM Kislovskiy, TP Vladimirova, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 31 (9), 1205-1222, 2009 | 3 | 2009 |
| X-Ray Diffraction Characterization of Nanoscale Strains and Defects in Yttrium Iron Garnet Films Implanted with Fluorine Ions S Olikhovskii, O Skakunova, V Molodkin, V Lizunov, Y Kyslovs' kyy, ... Proceedings of the International Conference Nanomaterials: Applications and …, 2014 | 1 | 2014 |
| Dynamical Diffractometry of Defects and Strains in Gd3Ga5O12 Garnet Crystals After Implantation with F+ Ions OS Skakunova, VM Pylypiv, TP Vladimirova, SI Olikhovskii, VB Molodkin, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 35 (12), 1595-1608, 2013 | 1 | 2013 |
| X-Ray Diffractometry of Transformations in Microdefect Structure of Silicon Crystals after High-Energy Electron Irradiation IM Fodchuk, TP Vladimirova, VV Dovganyuk, OV Reshetnyk, VP Klad'ko, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 32 (9), 1213-1229, 2010 | 1 | 2010 |
| High-resolution X-ray diffraction investigations of silicon grown by the float-zone method VB Molodkin, M Ando, EN Kislovskii, SI Olikhovskii, TP Vladimirova, ... METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 24 (4), 541-552, 2002 | 1 | 2002 |
S. I. OlikhovskiiLeading researcher, Professor, Dr. Sci. Phys.Math, G. V. Kurdyumov Institute for Metal PhysicsVerified email at imp.kiev.ua
