Підписатись
Mohamed  Emam-Ismail
Mohamed Emam-Ismail
Professor of Physics at Galala University and Ain Shams University
Підтверджена електронна адреса в Gu.edu.Eg
Назва
Посилання
Посилання
Рік
Continuous wave observation of massive polariton redistribution by stimulated scattering in semiconductor microcavities
Stevenson, R.M., Astratov, V.N., Skolnick, M.S
Physical Review Letters 85 ((17)), pp. 3680-3683, 2000
5812000
Relaxation bottleneck and its suppression in semiconductor microcavities
AI Tartakovskii, M Emam-Ismail, RM Stevenson, MS Skolnick, VN Astratov, ...
Physical Review B 62 (4), R2283, 2000
2152000
Composition, annealing and thickness dependence of structural and optical studies on Zn1-xMnxS nanocrystalline semiconductor thin films Materials Chemistry and Physics
El-Hagary, M., Emam-Ismail, M., Shaaban, E.R.
Materials Chemistry and Physics 132 (2-3), pp. 581-590, 2012
812012
Structural, linear and nonlinear optical properties of co-doped ZnO thin films
ER Shaaban, M El-Hagary, ES Moustafa, HS Hassan, YAM Ismail, ...
Applied Physics A 122, 1-10, 2016
702016
Raman scattering in strongly coupled organic semiconductor microcavities
VM Tartakovskii, A.I., Emam-Ismail, M., Lidzey, D.G
Physical Review B - Condensed Matter and Materials Physics , 63 ((12 …, 2001
672001
Giant enhancement of polariton relaxation in semiconductor microcavities by polariton-free carrier interaction: Experimental evidence and theory
JS Tartakovskii, A.I., Krizhanovskii, D.N., Malpuech
Physical Review B - Condensed Matter and Materials Physics 67 (16), art. no …, 2003
642003
Effect of γ-irradiation exposure on optical properties of chalcogenide glasses Se 70S 30-xSb x thin films
M El-Hagary, M Emam-Ismail, ER Shaaban, A El-Taher
Radiation Physics and Chemistry 81 (10), pp. 1572-1577, 2013
632013
Structural, optical and dispersion energy parameters of nickel oxide nanocrystalline thin films prepared by electron beam deposition technique
MM El-Nahass, M Emam-Ismail, M El-Hagary
Journal of Alloys and Compounds 646, 937-945, 2015
592015
Thickness and annealing effects on the optoelectronic properties of ZnS films
Mohamed,S.H., El-Hagary,M., M. Emam-Ismail
Journal of Physics D: Applied Physics , 43 ((7)), art. no. 075401, 2010
522010
Structural and optical investigation of nanocrystalline Zn 1-xNi xS diluted magnetic semiconductor thin films
M Emam-Ismail, M El-Hagary, ER Shaaban, S Althoyaib
Journal of Alloys and Compounds 529, pp. 113-121, 2012
502012
Microstructure and optical studies of electron beam evaporated ZnSe1-xTex nanocrystalline thin films
M Emam-Ismail, M El-Hagary, ER Shaaban, AM Al-Hedeib
Journal of Alloys and Compounds 532, pp. 16-24, 2012
492012
Spectroscopic ellipsometry and morphological studies of nanocrystalline NiO and NiO/ITO thin films deposited by e-beams technique
M Emam-Ismail, M El-Hagary, H El-Sherif, A El-Naggar, MM El-Nahass
optical materials 112, 110763, 2021
422021
Optical band gap, refractive index dispersion and single-oscillator parameters of amorphous Se70S30-xSbx semiconductor thin films
ER Shaaban, M El-Hagary, M Emam-Ismail, MB El-Den
Philosophical Magazine 91 (12), pp. 1679-1692, 2011
422011
Optical properties of glasses (TeO2-GeO2-K2O) thin films co-doped with rare earth oxides Sm2O3/Yb2O3
M El-Hagary, M Emam-Ismail, ER Shaaban, I Shaltout
Journal of Alloys and Compounds 485 ((1-2)), pp. 519-523, 2009
362009
Optical investigation of electron-beam-deposited tungsten-tellurite (TeO2)100-x(WO3)x amorphous films
M Emam-Ismail, ER Shaaban, M El-Hagary, I Shaltout
Philosophical Magazine 90 (25), pp. 3499-3509, 2010
342010
Spectroscopic ellipsometry and morphological characterizations of nanocrystalline Hg1-xMnxO oxide diluted magnetic semiconductor thin films
M Emam-Ismail, M El-Hagary, ER Shaaban, SH Moustafa, GMA Gad
Ceramics International 45, 8380-8387, 2019
332019
Spectroscopic ellipsometry and magneto-transport investigations of Mn-doped ZnO nanocrystalline films deposited by a non-vacuum sol-gel spin-coating method
ER Shaaban, M El-Hagary, M Emam-Ismail, A Matar, IS Yahia
Materials Science and Engineering B: Solid-State Materials for Advanced …, 2013
322013
Structural and optical analysis of nanocrystalline thin films of mixed rare earth oxides (Y 1–x Er x) 2 O 3
M El-Hagary, M Emam-Ismail, SH Mohamed, AS Hamid, S Althoyaib
Thin Solid Films 518, 4058, 2010
322010
Spectral variation of the birefringence, group birefringence and retardance of a gypsum plate measured using the interference of polarized light
M Emam-Ismail
Optics and Laser Technology 41 (5), pp. 615-621, 2009
312009
Optical and microstructural characterization of nanocrystalline Cu doped ZnO diluted magnetic semiconductor thin film for optoelectronic applications
GA Ali, M Emam-Ismail, M El-Hagary, ER Shaaban, SH Moustafa, ...
Optical Materials 119, 111312, 2021
292021
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