| Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum DA Minkov Journal of Physics D: Applied Physics 22 (8), 1157, 1989 | 165 | 1989 |
| NDE of degradation of thermal barrier coating by means of impedance spectroscopy K Ogawa, D Minkov, T Shoji, M Sato, H Hashimoto Ndt & E International 32 (3), 177-185, 1999 | 102 | 1999 |
| Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films JM González-Leal, R Prieto-Alcon, JA Angel, DA Minkov, E Marquez Applied optics 41 (34), 7300-7308, 2002 | 92 | 2002 |
| Method for determining the optical constants of a thin film on a transparent substrate DA Minkov Journal of Physics D: Applied Physics 22 (1), 199, 1989 | 89 | 1989 |
| Estimating the sizes of surface cracks based on Hall element measurements of the leakage magnetic field and a dipole model of a crack D Minkov, Y Takeda, T Shoji, J Lee Applied Physics A 74, 169-176, 2002 | 68 | 2002 |
| Optical properties of Ge-As-S thin films D Minkov, E Vateva, E Skordeva, D Arsova, M Nikiforova Journal of Non Crystalline Solids 90 (1), 481-484, 1987 | 63 | 1987 |
| Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra JJ Ruíz-Pérez, JM González-Leal, DA Minkov, E Márquez Journal of Physics D: Applied Physics 34 (16), 2489, 2001 | 60 | 2001 |
| Method for sizing of 3-D surface breaking flaws by leakage flux D Minkov, T Shoji NDT & E International 31 (5), 317-324, 1998 | 60 | 1998 |
| Study of crack inversions utilizing dipole model of a crack and Hall element measurements D Minkov, J Lee, T Shoji Journal of magnetism and magnetic materials 217 (1-3), 207-215, 2000 | 44 | 2000 |
| Computation of the optical constants of a thin dielectric layer on a transmitting substrate from the reflection spectrum at inclined incidence of light D Minkov JOSA A 8 (2), 306-310, 1991 | 44 | 1991 |
| Computerization of the optical characterization of a thin dielectric film D Minkov, R Swanepoel Optical Engineering 32 (12), 3333-3337, 1993 | 41 | 1993 |
| Optical characterization of thermally evaporated thin films of As40S40Se20 chalcogenide glass by reflectance measurements E Marquez, JM González-Leal, R Prieto-Alcón, M Vlcek, A Stronski, ... Applied Physics A 67, 371-378, 1998 | 37 | 1998 |
| The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates E Márquez, E Saugar, JM Díaz, C García-Vázquez, SM Fernández-Ruano, ... Journal of Non-Crystalline Solids 517, 32-43, 2019 | 27 | 2019 |
| Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum DA Minkov, GM Gavrilov, GV Angelov, JMD Moreno, CG Vazquez, ... Thin Solid Films 645, 370-378, 2018 | 25 | 2018 |
| Estimation of soft X-ray and EUV transition radiation power emitted from the MIRRORCLE-type tabletop synchrotron N Toyosugi, H Yamada, D Minkov, M Morita, T Yamaguchi, S Imai Journal of Synchrotron Radiation 14 (2), 212-218, 2007 | 22 | 2007 |
| Optical characterization of amine-solution-processed amorphous AsS2 chalcogenide thin films by the use of transmission spectroscopy E Márquez, JM Díaz, C García-Vázquez, E Blanco, JJ Ruiz-Pérez, ... Journal of Alloys and Compounds 721, 363-373, 2017 | 20 | 2017 |
| Flow-graph approach for optical analysis of planar structures D Minkov Applied optics 33 (33), 7698-7703, 1994 | 18 | 1994 |
| Theory and characteristics of transition radiation emitted by low-energy storage-ring synchrotrons for use in X-ray lithography D Minkov, H Yamada, N Toyosugi, T Yamaguchi, T Kadono, M Morita Journal of synchrotron radiation 13 (4), 336-342, 2006 | 16 | 2006 |
| Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum DA Minkov, GM Gavrilov, JMD Moreno, CG Vazquez, E Marquez Measurement Science and Technology 28 (3), 035202, 2017 | 15 | 2017 |
| Computation of the optical constants of a thin dielectric layer from the envelopes of the transmission spectrum, at inclined incidence of the radiation DA Minkov Journal of Modern Optics 37 (12), 1977-1986, 1990 | 15 | 1990 |
