| Hotspot detection based on machine learning JAT Robles, SM Fahmy, K Madkour, JY Wuu US Patent 8,402,397, 2013 | 126 | 2013 |
| Rapid layout pattern classification JY Wuu, FG Pikus, A Torres, M Marek-Sadowska 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011), 781-786, 2011 | 73 | 2011 |
| Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching JY Wuu, FG Pikus, M Marek-Sadowska Design for Manufacturability through Design-Process Integration V 7974, 243-250, 2011 | 37 | 2011 |
| Detecting context sensitive hot spots in standard cell libraries JY Wuu, FG Pikus, A Torres, M Marek-Sadowska Design for Manufacturability through Design-Process Integration III 7275 …, 2009 | 35 | 2009 |
| Hybrid hotspot detection JAT Robles, SM Fahmy, PLR Beshay, K Madkour, FG Pikus, JY Wuu, ... US Patent 8,504,949, 2013 | 26 | 2013 |
| Soc test scheduling using the b-tree based floorplanning technique JY Wuu, TC Chen, YW Chang Proceedings of the 2005 Asia and South Pacific Design Automation Conference …, 2005 | 26 | 2005 |
| Fast and simple modeling of non-rectangular transistors JY Wuu, FG Pikus, M Marek-Sadowska Photomask Technology 2008 7122, 1207-1216, 2008 | 13 | 2008 |
| Metrics for characterizing machine learning-based hotspot detection methods JY Wuu, FG Pikus, M Marek-Sadowska 2011 12th International Symposium on Quality Electronic Design, 1-6, 2011 | 6 | 2011 |
| Methods for generating characteristic pattern and training machine learning model MC Simmons, C Lin, JY Wuu US Patent App. 17/281,123, 2021 | 3 | 2021 |
| Stochastic defect criticality prediction enabled by physical stochastic modeling and massive metrology CA Wang, P Cao, M Delorme, JY Wuu, J Fu, F Wang, B Lin, Y Zhao, ... Extreme Ultraviolet (EUV) Lithography XII 11609, 95-103, 2021 | 3 | 2021 |
| Post-placement lithographic hotspot detection and removal in one-dimensional gridded designs JY Wuu, M Simmons, M Marek-Sadowska Thirteenth International Symposium on Quality Electronic Design (ISQED), 193-199, 2012 | 2 | 2012 |
| Feature extraction method for extracting feature vectors for identifying pattern objects LI Danying, M Liu, JY Wuu, SUN Rencheng, C Wu, D Xu US Patent App. 18/265,431, 2024 | | 2024 |
| Systems, products, and methods for image-based pattern selection SUN Rencheng, Q Jia, M Liu, HU Weixuan, JY Wuu, H Chen US Patent App. 18/018,034, 2023 | | 2023 |
| Layout optimization through robust pattern learning and prediction in SADP gridded designs JY Wuu, M Simmons, M Marek-Sadowska Design for Manufacturability through Design-Process Integration VI 8327, 42-48, 2012 | | 2012 |
| Design Methodologies for Optical Lithography Induced Systematic Variations JY Wuu University of California, Santa Barbara, 2011 | | 2011 |
