Webb R*
Webb R*
Surrey or Salford or Monterey
Подтвержден адрес электронной почты в домене surrey.ac.uk
Название
Процитировано
Процитировано
Год
Simulated annealing analysis of Rutherford backscattering data
NP Barradas, C Jeynes, RP Webb
Applied Physics Letters 71 (2), 291-293, 1997
7001997
Elemental thin film depth profiles by ion beam analysis using simulated annealing-a new tool
C Jeynes, NP Barradas, PK Marriott, G Boudreault, M Jenkin, E Wendler, ...
Journal of Physics D: Applied Physics 36 (7), R97, 2003
2102003
“Total IBA”–Where are we?
C Jeynes, MJ Bailey, NJ Bright, ME Christopher, GW Grime, BN Jones, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
1162012
The new Surrey ion beam analysis facility
A Simon, C Jeynes, RP Webb, R Finnis, Z Tabatabaian, PJ Sellin, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
1012004
Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary …
MJ Bailey, NJ Bright, RS Croxton, S Francese, LS Ferguson, S Hinder, ...
Analytical chemistry 84 (20), 8514-8523, 2012
892012
Rapid detection of cocaine, benzoylecgonine and methylecgonine in fingerprints using surface mass spectrometry
MJ Bailey, R Bradshaw, S Francese, TL Salter, C Costa, M Ismail, ...
Analyst 140 (18), 6254-6259, 2015
872015
Accurate RBS measurements of the indium content of InGaAs thin films
C Jeynes, ZH Jafri, RP Webb, AC Kimber, MJ Ashwin
Surface and Interface Analysis: An International Journal devoted to the …, 1997
751997
Energy spike generation and quenching processesin ion bombardment induced amorphizationof solids
G Carter, DG Armour, SE Donnelly, R Webb
Radiation Effects 36 (1-2), 1-13, 1978
661978
The accumulation of amorphousness as a function of irradiation fluence in a composite model of disorder production
G Carter, R Webb
Radiation Effects 43 (1), 19-24, 1979
651979
Internal Energy of Molecules Ejected Due to Energetic C60 Bombardment
BJ Garrison, Z Postawa, KE Ryan, JC Vickerman, RP Webb, N Winograd
Analytical chemistry 81 (6), 2260-2267, 2009
632009
Energetic fullerene interactions with a graphite surface
R Smith, RP Webb
Proceedings of the Royal Society of London. Series A: Mathematical and …, 1993
631993
Computer-simulated energy and angular distributions of sputtered Cu atoms
MH Shapiro, PK Haff, TA Tombrello, DE Harrison Jr, RP Webb
Radiation effects 89 (3-4), 243-255, 1985
621985
Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS
MJ Bailey, BN Jones, S Hinder, J Watts, S Bleay, RP Webb
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010
592010
Unambiguous automatic evaluation of multiple ion beam analysis data with simulated annealing
NP Barradas, C Jeynes, RP Webb, U Kreissig, R Grötzschel
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
581999
The effects of ion implantation on the interdiffusion coefficients in InxGa1−xAs/GaAs quantum well structures
IV Bradley, WP Gillin, KP Homewood, RP Webb
Journal of applied physics 73 (4), 1686-1692, 1993
561993
Enhanced imaging of developed fingerprints using mass spectrometry imaging
MJ Bailey, M Ismail, S Bleay, N Bright, ML Elad, Y Cohen, B Geller, ...
Analyst 138 (21), 6246-6250, 2013
542013
The injection of inert gas ions into solids: their trapping and escape
G Carter, DG Armour, SE Donnelly, DC Ingram, RP Webb
Radiation Effects 53 (3-4), 143-173, 1980
541980
Computer simulation of pit formation in metals by ion bombardment
RP Webb, DE Harrison Jr
Physical Review Letters 50 (19), 1478, 1983
511983
Difficulties in deducing disordering mechanisms from experimental studies of disorder-ion fluence functions in ion irradiation of semiconductors
R Webb, G Carter
Radiation Effects 42 (3-4), 159-168, 1979
511979
A second-order erosion slowness theory of the development of surface topography by ion-induced sputtering
G Carter, MJ Nobes, RP Webb
Journal of Materials Science 16 (8), 2091-2102, 1981
481981
В данный момент система не может выполнить эту операцию. Повторите попытку позднее.
Статьи 1–20