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lysenko V
lysenko V
Institute of Semiconductor Physics NAS of Ukraine
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Semiconductor-on-insulator materials for nanoelectronics applications
A Nazarov, JP Colinge, F Balestra, JP Raskin, F Gamiz, VS Lysenko
Springer Berlin Heidelberg, 2011
1682011
Nanoparticles as antiviral agents against adenoviruses
V Lysenko, V Lozovski, M Lokshyn, YV Gomeniuk, A Dorovskih, ...
Advances in Natural Sciences: Nanoscience and Nanotechnology 9 (2), 025021, 2018
932018
Light emission and charge trapping in Er-doped silicon dioxide films containing silicon nanocrystals
A Nazarov, JM Sun, W Skorupa, RA Yankov, IN Osiyuk, IP Tjagulskii, ...
Applied Physics Letters 86 (15), 2005
782005
Anti-inflammatory and antioxidant effect of cerium dioxide nanoparticles immobilized on the surface of silica nanoparticles in rat experimental pneumonia
Z Serebrovska, RJ Swanson, V Portnichenko, A Shysh, S Pavlovich, ...
Biomedicine & Pharmacotherapy 92, 69-77, 2017
592017
Color control of white photoluminescence from carbon-incorporated silicon oxide
Y Ishikawa, AV Vasin, J Salonen, S Muto, VS Lysenko, AN Nazarov, ...
Journal of Applied Physics 104 (8), 2008
562008
Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides
T Rudenko, V Kilchytska, S Burignat, JP Raskin, F Andrieu, O Faynot, ...
Solid-State Electronics 54 (2), 164-170, 2010
472010
Trapping of negative and positive charges in ion implanted silicon dioxide layers subjected to high-field electron injection
AN Nazarov, T Gebel, L Rebohle, W Skorupa, IN Osiyuk, VS Lysenko
Journal of applied physics 94 (7), 4440-4448, 2003
452003
Kinetics of structural and phase transformations in thin SiOx films in the course of a rapid thermal annealing
VA Dan’ko, IZ Indutnyi, VS Lysenko, IY Maidanchuk, VI Min’ko, ...
Semiconductors 39, 1197-1203, 2005
442005
The effect of rare-earth clustering on charge trapping and electroluminescence in rare-earth implanted metal-oxide-semiconductor light-emitting devices
AN Nazarov, SI Tiagulskyi, IP Tyagulskyy, VS Lysenko, L Rebohle, ...
Journal of Applied Physics 107 (12), 2010
432010
Physical point of view for antiviral effect caused by the interaction between the viruses and nanoparticles
V Lozovski, V Lysenko, V Piatnytsia, O Scherbakov, N Zholobak, M Spivak
Journal of Bionanoscience 6 (2), 109-112, 2012
412012
Comparative study of annealing and oxidation effects in a-SiC: H and a-SiC thin films deposited by radio-frequency magnetron sputtering
AV Vasin, S Muto, Y Ishikawa, AV Rusavsky, T Kimura, VS Lysenko, ...
Thin Solid Films 519 (7), 2218-2224, 2011
402011
Structure, paramagnetic defects and light-emission of carbon-rich a-SiC: H films
AV Vasin, SP Kolesnik, AA Konchits, AV Rusavsky, VS Lysenko, ...
Journal of Applied Physics 103 (12), 2008
372008
Impact ionization induced dynamic floating body effect in junctionless transistors
R Yu, AN Nazarov, VS Lysenko, S Das, I Ferain, P Razavi, M Shayesteh, ...
Solid-state electronics 90, 28-33, 2013
362013
Carrier transport in amorphous SiC/crystalline silicon heterojunctions
AN Nazarov, YN Vovk, VS Lysenko, VI Turchanikov, VA Scryshevskii, ...
Journal of Applied Physics 89 (8), 4422-4428, 2001
332001
Charge trapping in light-emitting layers implanted with ions
T Gebel, L Rebohle, W Skorupa, AN Nazarov, IN Osiyuk, VS Lysenko
Applied physics letters 81 (14), 2575-2577, 2002
312002
Border traps in 6H-SiC metal–oxide–semiconductor capacitors investigated by the thermally-stimulated current technique
HÖ Ólafsson, EÖ Sveinbjörnsson, TE Rudenko, IP Tyagulski, IN Osiyuk, ...
Applied physics letters 79 (24), 4034-4036, 2001
292001
Electrical properties and radiation hardness of SOI systems with multilayer buried dielectric
IP Barchuk, VI Kilchitskaya, VS Lysenko, AN Nazarov, TE Rudenko, ...
IEEE Transactions on Nuclear science 44 (6), 2542-2552, 1997
291997
Light-emitting properties of amorphous Si: C: O: H layers fabricated by oxidation of carbon-rich a-Si: C: H films
AV Vasin, Y Ishikawa, SP Kolesnik, AA Konchits, VS Lysenko, ...
Solid state sciences 11 (10), 1833-1837, 2009
272009
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers
AN Nazarov, VS Lysenko, TM Nazarova
Semiconductor Physics Quantum Electronics & Optoelectronics, 2008
242008
Effect of oxide–semiconductor interface traps on low-temperature operation of MOSFETs
VS Lysenko, IP Tyagulski, YV Gomeniuk, IN Osiyuk
Microelectronics Reliability 40 (4-5), 735-738, 2000
242000
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