Alexander Stronski
Alexander Stronski
Head of department, Institute of Semiconductor Physics NAS Ukraine
Підтверджена електронна адреса в isp.kiev.ua
Назва
Посилання
Посилання
Рік
Holographic optical element fabrication using chalcogenide layers
I.Z.Indutnyi, A.V.Stronski, S.A.Kostyukevich, P.F.Romanenko, P.E Shepeliavi
Optical Engineering 34 (4), 1030-1039, 1995
991995
Modulated-temperature differential scanning calorimetry and Raman spectroscopy studies of AsxS100− x glasses
T Wagner, SO Kasap, M Vlcek, A Sklenar, A Stronski
Journal of materials science 33 (23), 5581-5588, 1998
611998
Application of As40S60− xSex layers for high-efficiency grating production
AV Stronski, M Vlček, A Sklenar, PE Shepeljavi, SA Kostyukevich, ...
Journal of non-crystalline solids 266, 973-978, 2000
592000
Photosensitive properties of chalcogenide vitreous semiconductors in diffractive and holographic technologies applications
AV Stronski, M Vl
522002
Structure and imaging properties of As40S60− xSex glasses
M Vlček, AV Stronski, A Sklenař, T Wagner, SO Kasap
Journal of Non-Crystalline Solids 266, 964-968, 2000
462000
The structure of AsxS100− x glasses studied by temperature-modulated differential scanning calorimetry and Raman spectroscopy
T Wagner, SO Kasap, M Vlček, A Sklenař, A Stronski
Journal of non-crystalline solids 227, 752-756, 1998
371998
Comparison of structural transforma‐tions in bulk and as‐evaporated optical media under action of polychromatic or photon‐energy dependent monochromatic illumination
R Holomb, V Mitsa, O Petrachenkov, M Veres, A Stronski, M Vlček
physica status solidi (c) 8 (9), 2705-2708, 2011
362011
Photo-stimulated Processes in Chalcogenide Glassy Semiconductors and Their Practical Application
EF Venger, AV Melnichuk, AV Stronski
Akademperiodika, Kiev, 2007
362007
Raman spectra of Ag-and Cu-photo-doped As40S60− xSex films
AV Stronski, M Vlček, AI Stetsun, A Sklenař, PE Shepeliavyi
Journal of non-crystalline solids 270 (1-3), 129-136, 2000
322000
Direct surface relief formation on As2S3–Se nanomultilayers in dependence on polarization states of recording beams
E Achimova, A Stronski, V Abaskin, A Meshalkin, A Paiuk, A Prisacar, ...
Optical Materials 47, 566-572, 2015
302015
Optical characterization of thermally evaporated thin films of As40S40Se20 chalcogenide glass by reflectance measurements
E Marquez, JM González-Leal, R Prieto-Alcón, M Vlcek, A Stronski, ...
Applied Physics A 67 (3), 371-378, 1998
301998
Thermal relaxation of the structural and optical properties of amorphous As40S60− xSex films
JM Gonzalez-Leal, M Vlček, R Prieto-Alcon, A Stronski, T Wagner, ...
Journal of non-crystalline solids 326, 146-153, 2003
292003
Recording of holographic optical elements on As-S-Sr layers
AV Stronski, PF Romanenko, II Robur, IZ Indutnyi, PE Shepelyavi
Journal of information recording materials (1985) 20 (6), 541-546, 1993
281993
Holographic and e-beam image recording in Ge 5 As 37 S 58–Se nanomultilayer structures
A Stronski, E Achimova, O Paiuk, A Meshalkin, V Abashkin, O Lytvyn, ...
Nanoscale research letters 11 (1), 1-7, 2016
272016
Surface relief formation in Ge5As37S58–Se nanomultilayers
A Stronski, E Achimova, A Paiuk, V Abaskin, A Meshalkin, A Prisacar, ...
Journal of Non-Crystalline Solids 409, 43-48, 2015
272015
Effect of doping by transitional elements on properties of chalcogenide glasses
A Stronski, O Paiuk, A Gudymenko, V Klad’Ko, P Oleksenko, N Vuichyk, ...
Ceramics International 41 (6), 7543-7548, 2015
252015
Ellipsometry and AFM study of post-deposition transformations in vacuum-evaporated As–S–Se films
MV Sopinskyy, PE Shepeliavyi, AV Stronski, EF Venger
J Optoelectron Adv Mater 7 (5), 2255-66, 2005
222005
Study of non-reversible photostructural transformations in As₄₀S₆₀-xSex layers applied for fabrication of holographic protective elements
AV Stronski, M Vlcek, SA Kostyukevych, VM Tomchuk, EV Kostyukevych, ...
Semiconductor Physics Quantum Electronics & Optoelectronics, 2002
222002
Imaging properties of As40S40Se20 layers
AV Stronski, M Vlček
Opto-Electronics Review 8 (3), 263-267, 2000
212000
Imaging properties of As40S40Se20 layers
AV Stronski, M Vlček
Opto-Electronics Review 8 (3), 263-267, 2000
212000
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