On the reliability of majority gates full adders W Ibrahim, V Beiu, MH Sulieman IEEE Transactions on nanotechnology 7 (1), 56-67, 2008 | 82 | 2008 |
Using Bayesian networks to accurately calculate the reliability of complementary metal oxide semiconductor gates W Ibrahim, V Beiu IEEE Transactions on Reliability 60 (3), 538-549, 2011 | 57 | 2011 |
A web-based course assessment tool with direct mapping to student outcomes W Ibrahim, Y Atif, K Shuaib, D Sampson Educational Technology and Society 18 (2), 46-59, 2015 | 40 | 2015 |
Improving solver success in reaching feasibility for sets of nonlinear constraints W Ibrahim, JW Chinneck Computers & Operations Research 35 (5), 1394-1411, 2008 | 34 | 2008 |
Using the iPad as a pedagogical tool to enhance the learning experince for novice programing students H Amer, W Ibrahim 2014 IEEE Global Engineering Education Conference (EDUCON), 178-183, 2014 | 33 | 2014 |
GREDA: A fast and more accurate gate reliability EDA tool W Ibrahim, V Beiu, A Beg IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012 | 31 | 2012 |
Devices and input vectors are shaping von Neumann multiplexing V Beiu, W Ibrahim IEEE transactions on nanotechnology 10 (3), 606-616, 2010 | 27 | 2010 |
Optimum reliability sizing for complementary metal oxide semiconductor gates W Ibrahim, V Beiu, A Beg IEEE Transactions on Reliability 61 (3), 675-686, 2012 | 26 | 2012 |
Low-power and highly reliable logic gates transistor-level optimizations MH Sulieman, V Beiu, W Ibrahim 10th IEEE International Conference on Nanotechnology, 254-257, 2010 | 26 | 2010 |
On computing nano-architectures using unreliable nano-devices V Beiu, W Ibrahim Nano and Molecular Electronics Handbook, 12-1-12-49, 2018 | 25 | 2018 |
Teaching ethical hacking in information security curriculum: A case study Z Trabelsi, W Ibrahim 2013 IEEE Global Engineering Education Conference (EDUCON), 130-137, 2013 | 25 | 2013 |
Reliability of NAND-2 CMOS gates from threshold voltage variations W Ibrahim, V Beiu 2009 International Conference on Innovations in Information Technology (IIT …, 2009 | 24 | 2009 |
Serial addition: Locally connected architectures V Beiu, S Aunet, J Nyathi, RR Rydberg, W Ibrahim IEEE Transactions on Circuits and Systems I: Regular Papers 54 (11), 2564-2579, 2007 | 23 | 2007 |
A hands-on approach for teaching denial of service attacks: a case study Z Trabelsi, W Ibrahim Journal of Information Technology Education. Innovations in Practice 12, 299, 2013 | 22 | 2013 |
Accurate and efficient estimation of logic circuits reliability bounds W Ibrahim, M Shousha, JW Chinneck IEEE Transactions on Computers 64 (5), 1217-1229, 2014 | 21 | 2014 |
A fresh look at majority multiplexing when devices get into the picture V Beiu, W Ibrahim, S Lazarova-Molnar 2007 7th IEEE Conference on Nanotechnology (IEEE NANO), 883-888, 2007 | 20 | 2007 |
Gate failures effectively shape multiplexing V Beiu, W Ibrahim, YA Alkhawwar, MH Sulieman 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2006 | 20 | 2006 |
On teaching circuit reliability A Beg, W Ibrahim 2008 38th Annual Frontiers in Education Conference, T3H-12-T3H-17, 2008 | 19 | 2008 |
Does the brain really outperform Rent’s rule? V Beiu, W Ibrahim 2008 IEEE International Symposium on Circuits and Systems, 640-643, 2008 | 19 | 2008 |
Identifying the worst reliability input vectors and the associated critical logic gates W Ibrahim IEEE Transactions on Computers 65 (6), 1748-1760, 2015 | 18 | 2015 |