Multisensor data fusion in dimensional metrology A Weckenmann, X Jiang, KD Sommer, U Neuschaefer-Rube, J Seewig, ... CIRP annals 58 (2), 701-721, 2009 | 372 | 2009 |
Linear and robust Gaussian regression filters J Seewig Journal of Physics: conference series 13 (1), 254, 2005 | 106 | 2005 |
Automated scenario generation for regression testing of autonomous vehicles E Rocklage, H Kraft, A Karatas, J Seewig 2017 ieee 20th international conference on intelligent transportation …, 2017 | 95 | 2017 |
Unambiguous evaluation of a chirp measurement standard J Seewig, M Eifler, G Wiora Surface Topography: Metrology and Properties 2 (4), 045003, 2014 | 46 | 2014 |
Optisches Messen technischer Oberflächen: Messprinzipien und Begriffe M Rahlves Beuth Verlag, 2009 | 39 | 2009 |
Calibration sample for arbitrary metrological characteristics of optical topography measuring instruments M Eifler, J Hering, G Von Freymann, J Seewig Optics express 26 (13), 16609-16623, 2018 | 37 | 2018 |
Grinding energy modeling based on friction, plowing, and shearing BS Linke, I Garretson, F Torner, J Seewig Journal of Manufacturing Science and Engineering 139 (12), 121009, 2017 | 37 | 2017 |
Ti surface modification by cold spraying with TiO2 microparticles K Schmidt, S Buhl, N Davoudi, C Godard, R Merz, I Raid, E Kerscher, ... Surface and coatings technology 309, 749-758, 2017 | 36 | 2017 |
Manufacturing of new roughness standards for the linearity of the vertical axis–Feasibility study and optimization M Eifler, F Schneider, J Seewig, B Kirsch, JC Aurich Engineering Science and Technology, an International Journal 19 (4), 1993-2001, 2016 | 29 | 2016 |
Extraction of shape and roughness using scattering light J Seewig, G Beichert, R Brodmann, H Bodschwinna, M Wendel Optical Measurement Systems for Industrial Inspection VI 7389, 223-233, 2009 | 27 | 2009 |
Praxisgerechte signalverarbeitung zur trennung der gestaltabweichungen technischer oberflächen J Seewig Shaker, 2000 | 27 | 2000 |
Application of function-oriented roughness parameters using confocal microscopy K Klauer, M Eifler, J Seewig, B Kirsch, JC Aurich Engineering Science and Technology, an International Journal 21 (3), 302-313, 2018 | 25 | 2018 |
Manufacturing of the ISO 25178-70 material measures with direct laser writing: a feasibility study M Eifler, J Hering, G von Freymann, J Seewig Surface Topography: Metrology and Properties 6 (2), 024010, 2018 | 24 | 2018 |
Correlation between different cutting conditions, surface roughness and dimensional accuracy when ball end micro milling material measures with freeform surfaces K Klauer, M Eifler, B Kirsch, J Seewig, JC Aurich Machining Science and Technology 24 (3), 446-464, 2020 | 23 | 2020 |
Design and verification of geometric roughness standards by reverse engineering J Seewig, M Eifler, F Schneider, JC Aurich Procedia CIRP 45, 259-262, 2016 | 23 | 2016 |
Influence of kinematics and abrasive configuration on the grinding process of glass FJP Sousa, DS Hosse, I Reichenbach, JC Aurich, J Seewig Journal of materials processing Technology 213 (5), 728-739, 2013 | 21 | 2013 |
Areal filtering methods J Seewig Characterisation of Areal Surface Texture, 67-106, 2013 | 21 | 2013 |
3D roughness evaluation of cylinder liner surfaces based on structure-oriented parameters A Weidner, J Seewig, E Reithmeier Measurement Science and Technology 17 (3), 477, 2006 | 21 | 2006 |
Crossing-the-line segmentation as a basis for Rsm and Rc Evaluation J Seewig, PJ Scott, M Eifler, B Barwick, D Hüser Surface Topography: Metrology and Properties 8 (2), 024010, 2020 | 20 | 2020 |
Comparison of material measures for the determination of transfer characteristics of surface topography measuring instruments M Eifler, A Keksel, J Seewig Surface Topography: Metrology and Properties 7 (1), 015024, 2019 | 19 | 2019 |