Local deformation in diamond crystals defined by the Fourier transformations of Kikuchi patterns MD Borcha, SV Balovsyak, IM Fodchuk, VY Khomenko, OP Kroitor, ... Journal of Superhard Materials 35 (5), 284-291, 2013 | 13 | 2013 |
Concentration-dimension dependences for the electron energy in AlxGa1-xAs/GaAs/AlxGa1-xAs nanofilms DV Kondryuk, VM Kramar, OP Kroitor Semiconductor physics, quantum electronics & optoelectronics, 160-164, 2014 | 3 | 2014 |
Coincidental multiple X-ray diffraction as tool for precise investigation of crystals M Borcha, I Fodchuk, O Kroitor, Y Garabazhiv, O Kshevetsky Eighth International Conference on Correlation Optics 7008, 358-364, 2008 | 3 | 2008 |
Adaptive oriented filtration of digital images in the spatial domain SV Balovsyak, OV Derevyanchuk, IM Fodchuk, OP Kroitor, KS Odaiska, ... Photonics Applications in Astronomy, Communications, Industry, and High …, 2019 | 2 | 2019 |
Computer system for increasing the local contrast of railway transport images SV Balovsyak, OV Derevyanchuk, HO Kravchenko, OP Kroitor, ... Fifteenth International Conference on Correlation Optics 12126, 367-373, 2021 | | 2021 |
Concentration-size dependences for the electron energy in AlxGa₁₋ xAs/GaAs/AlxGa₁₋ xAs nanofilms DV Kondryuk, VM Kramar, OP Kroitor Semiconductor Physics Quantum Electronics & Optoelectronics, 2014 | | 2014 |
Structural features of interfaces in AlInSb films grown on GaAs substrates determined by multibeam X-ray diffraction MD Borcha, IM Fodchuk, OS Kshevetsky, OP Kroitor Phys. Lett 100, 012103, 2012 | | 2012 |
Multiwave X-ray diffraction in studies of dynamics of lattice parameter changing under external exposures; Mnogovolnovaya difraktsiya rentgenovskikh luchej v issledovaniyakh … MD Borcha, IM Fodchuk, OP Krojtor | | 2007 |
Structural changes in multilayer systems containing InxGa₁₋ xAs₁₋ yNy quantum wells IM Fodchuk, VB Gevyk, OG Gimchinsky, EN Kislovskii, OP Kroytor, ... Semiconductor Physics Quantum Electronics & Optoelectronics, 2003 | | 2003 |
Structure of multilayered InxGa1-xAs1-yN/GaAs systems by the data of a two-crystal X-ray diffractometry IM Fodchuk, OP Kroytor, VB Gevik, OG Gimchinsky, VB Molodkin, ... Metallofizika i Noveishie Tekhnologii 25 (9), 1219-1231, 2003 | | 2003 |
Analysis of strain relaxation in In {sub x} Ga {sub 1-x} As {sub 1-y} N {sub y}/GaAs multilayer structures by X-ray two-crystal diffractometry M Pessa, EM Pavelesku, IM Fodchuk, OG Gimchinsky, OP Kroytor, ... | | 2002 |
Вплив приповерхневої деформації на трьохвильове аномальне проходження рентгенівських променів КОП Борча М.Д, Гультай Л.Л. Науковий вісник Чернівецького університету. Фізика, 114-119, 1998 | | 1998 |
Analysis of strain relaxation in In x Ga 1-x As 1-y N y/GaAs multilayer structures by X-ray two-crystal diffractometry M Pessa, EM Pavelesku, IM Fodchuk, OG Gimchinsky, OP Kroytor, ... | | |
Multiwave X-ray diffraction in studies of dynamics of lattice parameter changing under external exposures MD Borcha, IM Fodchuk, OP Krojtor | | |