Andrei Sirenko
Title
Cited by
Cited by
Year
Soft-mode hardening in SrTiO 3 thin films
AA Sirenko, C Bernhard, A Golnik, AM Clark, J Hao, W Si, XX Xi
Nature 404 (6776), 373-376, 2000
2982000
In situ Raman scattering studies of alkali-doped single wall carbon nanotubes
A Claye, S Rahman, JE Fischer, A Sirenko, GU Sumanasekera, ...
Chemical Physics Letters 333 (1-2), 16-22, 2001
1842001
Electron and hole g factors measured by spin-flip Raman scattering in CdTe/Cd 1− x Mg x Te single quantum wells
AA Sirenko, T Ruf, M Cardona, DR Yakovlev, W Ossau, A Waag, ...
Physical Review B 56 (4), 2114, 1997
1841997
Observation of the first-order Raman scattering in SrTiO 3 thin films
AA Sirenko, IA Akimov, JR Fox, AM Clark, HC Li, W Si, XX Xi
Physical review letters 82 (22), 4500, 1999
1701999
High carrier mobility in transparent Ba1−xLaxSnO3 crystals with a wide band gap
X Luo, YS Oh, A Sirenko, P Gao, TA Tyson, K Char, SW Cheong
Applied Physics Letters 100 (17), 172112, 2012
1632012
Oxide thin films for tunable microwave devices
XX Xi, HC Li, W Si, AA Sirenko, IA Akimov, JR Fox, AM Clark, J Hao
Journal of Electroceramics 4 (2), 393-405, 2000
1482000
Electric-Field-Induced Soft-Mode Hardening in Films
IA Akimov, AA Sirenko, AM Clark, JH Hao, XX Xi
Physical review letters 84 (20), 4625, 2000
1112000
Spin-flip and acoustic-phonon Raman scattering in CdS nanocrystals
AA Sirenko, VI Belitsky, T Ruf, M Cardona, AI Ekimov, C Trallero-Giner
Physical Review B 58 (4), 2077, 1998
1111998
40-Gb/s tandem electroabsorption modulator
B Mason, A Ougazzaden, CW Lentz, KG Glogovsky, CL Reynolds, ...
IEEE Photonics Technology Letters 14 (1), 27-29, 2002
962002
In situ Raman scattering studies of the amorphous and crystalline Si nanoparticles
AA Sirenko, JR Fox, IA Akimov, XX Xi, S Ruvimov, Z Liliental-Weber
Solid state communications 113 (10), 553-558, 2000
822000
Electronic band structure and optical phonons of BaSnO3 and Ba0.97La0.03SnO3 single crystals: Theory and experiment
TN Stanislavchuk, AA Sirenko, AP Litvinchuk, X Luo, SW Cheong
Journal of Applied Physics 112 (4), 044108, 2012
692012
Growth, Structure, and Electronic Properties of Epitaxial Bismuth Telluride Topological Insulator Films on BaF2 (111) Substrates
O Caha, A Dubroka, J Humlicek, V Holy, H Steiner, M Ul-Hassan, ...
Crystal growth & design 13 (8), 3365-3373, 2013
642013
Bandgap bowing in BGaN thin films
A Ougazzaden, S Gautier, T Moudakir, Z Djebbour, Z Lochner, S Choi, ...
Applied Physics Letters 93 (8), 083118, 2008
592008
GaN materials growth by MOVPE in a new-design reactor using DMHy and NH3
S Gautier, C Sartel, S Ould-Saad, J Martin, A Sirenko, A Ougazzaden
Journal of Crystal Growth 298, 428-432, 2007
572007
Optical alignment of 2D-electron momenta in multiple quantum well structures
BP Zakharchenya, PS Kop'ev, DN Mirlin, DG Polakov, II Reshina, ...
Solid state communications 69 (3), 203-206, 1989
501989
Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films
S Park, Y Horibe, T Asada, LS Wielunski, N Lee, PL Bonanno, ...
Nano letters 8 (2), 720-724, 2008
442008
A new hard allotropic form of carbon: Dream or reality?
I Konyashin, V Khvostov, V Babaev, M Guseva, J Mayer, A Sirenko
International Journal of Refractory Metals and Hard Materials 24 (1-2), 17-23, 2006
442006
Metal–oxide bilayer Raman scattering in thin films
VI Merkulov, JR Fox, HC Li, W Si, AA Sirenko, XX Xi
Applied physics letters 72 (25), 3291-3293, 1998
411998
Microbeam high-resolution x-ray diffraction in strained InGaAlAs-based multiple quantum well laser structures grown selectively on masked InP substrates
AA Sirenko, A Kazimirov, R Huang, DH Bilderback, S O’Malley, V Gupta, ...
Journal of applied physics 97 (6), 063512, 2005
402005
Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability
TN Stanislavchuk, TD Kang, PD Rogers, EC Standard, R Basistyy, ...
Review of Scientific Instruments 84 (2), 023901, 2013
362013
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