| Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films S Park, Y Horibe, T Asada, LS Wielunski, N Lee, PL Bonanno, ... Nano letters 8 (2), 720-724, 2008 | 56 | 2008 |
| Structural and optical properties of nanodots, nanowires, and multi-quantum wells of III-nitride grown by MOVPE nano-selective area growth WH Goh, G Patriarche, PL Bonanno, S Gautier, T Moudakir, M Abid, ... Journal of Crystal Growth 315 (1), 160-163, 2011 | 43 | 2011 |
| Nanoscale selective area growth of thick, dense, uniform, In-rich, InGaN nanostructure arrays on GaN/sapphire template S Sundaram, R Puybaret, Y El Gmili, X Li, PL Bonanno, K Pantzas, ... Journal of Applied Physics 116 (16), 2014 | 25 | 2014 |
| High-resolution dislocation imaging and micro-structural analysis of HVPE-βGa2O3 films using monochromatic synchrotron topography NA Mahadik, MJ Tadjer, PL Bonanno, KD Hobart, RE Stahlbush, ... APL Materials 7 (2), 2019 | 23 | 2019 |
| Nanoselective area growth and characterization of dislocation-free InGaN nanopyramids on AlN buffered Si (111) templates S Sundaram, Y El Gmili, R Puybaret, X Li, PL Bonanno, K Pantzas, ... Applied Physics Letters 107 (11), 2015 | 20 | 2015 |
| High performance TiN gate contact on AlGaN/GaN transistor using a mechanically strain induced P-doping A Soltani, M Rousseau, JC Gerbedoen, M Mattalah, PL Bonanno, A Telia, ... Applied Physics Letters 104 (23), 2014 | 20 | 2014 |
| Intrafacet migration effects in InGaN∕ GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction PL Bonanno, SM O’Malley, AA Sirenko, A Kazimirov, ZH Cai, T Wunderer, ... Applied Physics Letters 92 (12), 2008 | 17 | 2008 |
| Epitaxial checkerboard arrangement of nanorods in films studied by x-ray diffraction SM O’Malley, PL Bonanno, KH Ahn, AA Sirenko, A Kazimirov, M Tanimura, ... Physical Review B 78 (16), 165424, 2008 | 8 | 2008 |
| Evolution of lattice distortions in 4H-SiC wafers with varying doping NA Mahadik, H Das, S Stoupin, RE Stahlbush, PL Bonanno, X Xu, ... Scientific Reports 10 (1), 10845, 2020 | 7 | 2020 |
| Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration procedures PL Bonanno, S Gautier, AA Sirenko, A Kazimirov, ZH Cai, WH Goh, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010 | 7 | 2010 |
| APL Mater. 7, 022513 (2019) NA Mahadik, MJ Tadjer, PL Bonanno, KD Hobart, RE Stahlbush, ... | 6 | |
| Defects in 4H-SiC epilayers affecting device yield and reliability R Stahlbush, N Mahadik, P Bonanno, J Soto, B Odekirk, W Sung, ... 2022 IEEE International Reliability Physics Symposium (IRPS), P65-1-P65-6, 2022 | 5 | 2022 |
| Single-crystal nanopyramidal BGaN by nanoselective area growth on AlN/Si (111) and GaN templates S Sundaram, X Li, Y El Gmili, PL Bonanno, R Puybaret, C Pradalier, ... Nanotechnology 27 (11), 115602, 2016 | 5 | 2016 |
| Mask effect in nano-selective-area-growth by MOCVD on thickness enhancement, indium incorporation, and emission of InGaN nanostructures on AlN-buffered Si (111) substrates Y El Gmili, PL Bonanno, S Sundaram, X Li, R Puybaret, G Patriarche, ... Optical Materials Express 7 (2), 376-385, 2017 | 3 | 2017 |
| Nondestructive mapping of chemical composition and structural qualities of group III-nitride nanowires using submicron beam synchrotron-based X-ray diffraction PL Bonanno, S Gautier, YE Gmili, T Moudakir, AA Sirenko, A Kazimirov, ... Thin solid films 541, 46-50, 2013 | 3 | 2013 |
| Evaluating Compositional Variation in InGaAs Random Alloys Using Atom Probe Tomography NA Kotulak, ME Twigg, NA Mahadik, S Tomasulo, PL Bonanno, ... Microscopy and Microanalysis 24 (S1), 398-399, 2018 | 2 | 2018 |
| X‐ray diffraction studies of selective area grown InGaN/GaN multiple quantum wells on multi‐facet GaN ridges SM O'Malley, PL Bonanno, T Wunderer, P Brückner, B Neubert, F Scholz, ... physica status solidi c 5 (6), 1655-1658, 2008 | 2 | 2008 |
| Selective growth of GaN Nanostructures on SiC by MOVPE and their strain relaxation study by submicron beam x-ray diffraction WH Goh, PL Bonanno, J Martin, S Gautier, N Maloufi, AA Sirenko, ... EW MOVPE 2009, 1-1, 2009 | 1 | 2009 |
| High-resolution dislocation imaging and micro-structural analysis of HVPE-Ga NA Mahadik, MJ Tadjer, PL Bonanno | | 2018 |
| Nano-selective-area growth of group III-nitrides on silicon and conventional substrates PL Bonanno Georgia Institute of Technology, 2016 | | 2016 |
Andrei SirenkoDepartment of Physics, New Jersey Institute of TechnologyVerified email at njit.edu
