Lawrence Scipioni
Lawrence Scipioni
PVD Products
Подтвержден адрес электронной почты в домене pvdproducts.com
Название
Процитировано
Процитировано
Год
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland
US Patent 7,241,361, 2007
702007
Helium ion microscopy for high‐resolution visualization of the articular cartilage collagen network
WS Vanden Berg‐Foels, L Scipioni, C Huynh, X Wen
Journal of microscopy 246 (2), 168-176, 2012
672012
Easy growth of undoped and doped tungsten oxide nanowires with high purity and orientation
K Liu, DT Foord, L Scipioni
Nanotechnology 16 (1), 10, 2004
562004
Performance of multicusp plasma ion source for focused ion beam applications
L Scipioni, D Stewart, D Ferranti, A Saxonis
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
452000
Dual beam system
R Hill, CA Sanford, L Scipioni, M DiManna, M Tanguay
US Patent 7,161,159, 2007
402007
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland
US Patent 8,168,957, 2012
362012
Multibeam System
M Utlaut, N Smith, PP Tesch, T Miller, DH Narum, D Tuggle, L Scipioni
US Patent App. 12/812,221, 2011
362011
Fabrication of three dimensional structures
L Scipioni
US Patent 7,160,475, 2007
362007
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland
US Patent 7,670,455, 2010
342010
System for imaging a cross-section of a substrate
S Berger, L Scipioni
US Patent 6,838,668, 2005
202005
Method of fabricating nanodevices
G Schwind, G Magera, L Scipioni
US Patent 7,544,523, 2009
192009
Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
J Keller, N Smith, R Boswell, L Scipioni, C Charles, O Sutherland
US Patent 8,829,468, 2014
182014
Sample decontamination
LA Stern, LS Farkas III, BW Ward, W DiNatale, JA Notte IV, L Scipioni
US Patent 8,013,300, 2011
182011
System for imaging a cross-section of a substrate
S Berger, L Scipioni
US Patent 6,727,500, 2004
172004
Dual beam system
R Hill, CA Sanford, L Scipioni, M DiManna, M Tanguay
US Patent 7,601,976, 2009
132009
Dual beam system
R Hill, L Scipioni, CA Sanford, M DiManna, M Tanguay
US Patent 8,013,311, 2011
92011
Determining end points during charged particle beam processing
V Ray, L Scipioni, N Bassom
US Patent App. 10/777,672, 2005
72005
In-situ and ex-situ comparison of the electrochemical oxidation of SO2 on carbon supported Pt and Au catalysts
BH Meekins, AB Thompson, V Gopal, BAT Mehrabadi, MC Elvington, ...
International Journal of Hydrogen Energy 45 (3), 1940-1947, 2020
52020
Gas field ion microscopes having multiple operation modes
L Scipioni
US Patent 8,455,840, 2013
42013
Ice layers in charged particle systems and methods
JA Notte IV, L Scipioni, BW Ward, WB Thompson
US Patent App. 12/625,912, 2010
42010
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