Evgen G. Len
Evgen G. Len
Dep. of electronic structure and electronic prop., G.V. Kurdyumov Institute for Metal Physics, NASU
Verified email at imp.kiev.ua - Homepage
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Bragg diffraction of X-rays by single crystals with large microdefects II. Dynamical diffuse scattering amplitude and intensity
SI Olikhovskii, VB Molodkin, EN Kislovskii, EG Len, EV Pervak
PHYSICA STATUS SOLIDI B BASIC RESEARCH 231 (1), 199-212, 2002
61*2002
Bragg Diffraction of X‐Rays by Single Crystals with Large Microdefects I. Generalized Dynamical Theory
VB Molodkin, SI Olikhovskii, EN Kislovskii, EG Len, EV Pervak
physica status solidi (b) 227 (2), 429-447, 2001
59*2001
Dynamical Bragg and diffuse scattering effects and implications for diffractometry in the twenty-first century
VB Molodkin, MV Kovalchuk, AP Shpak, SI Olikhovskii, YM Kyslovskyy, ...
Diffuse Scattering and the Fundamental Properties of Materials, 391-434, 2009
53*2009
Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in silicon
VB Molodkin, SI Olikhovskii, EG Len, EN Kislovskii, VP Kladko, ...
physica status solidi (a) 206 (8), 1761-1765, 2009
30*2009
Combined double‐and triple‐crystal X‐ray diffractometry with account for real defect structures in all crystals of X‐ray optical schemes
AP Shpak, VB Molodkin, SI Olikhovskii, YM Kyslovskyy, OV Reshetnyk, ...
physica status solidi (a) 204 (8), 2651-2656, 2007
16*2007
Bragg diffraction of X-rays by single crystals with large microdefects. III. High-resolution diffraction measurements
EN Kislovskii, SI Olikhovskii, VB Molodkin, VV Nemoshkalenko, ...
Physica status solidi. B. Basic research 231 (1), 213-221, 2002
162002
, and NV Chubins ky
SP Repetsky, YG Len
Met. Phys. Adv. Tech 17, 867, 1999
161999
Differential X-Ray Diffraction Characterization of the Complex Defect Structure in Silicon Single Crystals
OVR S. J. Olikhovsky, Ye. M. Kislovsky, V. B. Molodkin, Ye. G. Len, T. P ...
Metallofiz. Noveishie Tekhnol. 22 (6), 3-19, 2000
14*2000
The cause of anomaly of temperature dependence of electroresistance of the ordering nonstoichiometric FeCo compounds based on a bcc lattice
SP Repetsky, IM Melnyk, VA Tatarenko, EG Len, IG Vyshivanaya
Journal of alloys and compounds 480 (1), 13-15, 2009
82009
Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons
EN Kislovskii, VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, ...
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2013
7*2013
Metallofiz. Noveishie Tekhnol., 38
OM Ivasishin, EG Len, VM Nadutov, VA Tatarenko
62016
X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation
VB Molodkin, SI Olikhovskii, EG Len, BV Sheludchenko, SV Lizunova, ...
physica status solidi (a) 208 (11), 2552-2557, 2011
62011
Sposob Mnogoparametricheskoy Strukturnoy Diagnostiki Monokristallov s Neskolkimi Tipami Defektov
AP Shpak, MV Kovalchuk, VB Molodkin, AI Nizkova, IV Ginko, ...
Patent of Ukraine, 0
6
The role of defects in the crystal bulk and strains in disturbed surface layers in three single crystals at the formation of triple-crystal profiles of X-ray difractometry
SI Olikhovskii, VB Molodkin, EN Kislovskii, OV Reshetnyk, TP Vladimirova, ...
Metallofizika Noveishie Tekhnol 27, 947-968, 2005
52005
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, 575-588, 2014
4*2014
Electronic structure and spin transport in a Fe-Co alloy
SP Repetsky, EG Len, VV Lizunov
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 28 (8), 989-995, 2006
42006
Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures
SI Olikhovskii, VB Molodkin, OS Skakunova, EG Len, YM Kyslovskyy, ...
physica status solidi (b) 254 (7), 1600689, 2017
32017
Double-and triple-crystal X-ray diffractometry of microdefects in silicon
VB Molodkin, SI Olikhovskii, YM Kyslovskyy, EG Len, OV Reshetnyk, ...
Semiconductor Physics Quantum Electronics & Optoelectronics, 2010
3*2010
Electronic structure and magnetic domains in alloys with narrow energy bands
SP Repetsky, EG Len, VV Lizunov
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 28 (11), 1471-1475, 2006
32006
Observation and description of intensity oscillations in the diffuse X-ray scattering from microdefects in silicon
YM Kislovs' ky, SI Olikhovs' ky, VB Molodkin, YG Len, TP Vladimirova
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 22 (7), 21-30, 2000
3*2000
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