Ivo Utke
Ivo Utke
PhD, Empa-Swiss Federal Laboratories for Materials Science and Technology
Подтвержден адрес электронной почты в домене empa.ch - Главная страница
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Процитировано
Процитировано
Год
Gas-assisted focused electron beam and ion beam processing and fabrication
I Utke, P Hoffmann, J Melngailis
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
10052008
Measurement of the bending strength of vapor− liquid− solid grown silicon nanowires
S Hoffmann, I Utke, B Moser, J Michler, SH Christiansen, V Schmidt, ...
Nano letters 6 (4), 622-625, 2006
2852006
Nanofabrication using focused ion and electron beams: principles and applications
I Utke, S Moshkalev, P Russell
Oxford University Press, 2012
2732012
High-resolution magnetic Co supertips grown by a focused electron beam
I Utke, P Hoffmann, R Berger, L Scandella
Applied physics letters 80 (25), 4792-4794, 2002
1912002
Focused electron beam induced deposition of gold
I Utke, P Hoffmann, B Dwir, K Leifer, E Kapon, P Doppelt
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
1912000
Submicrometer Hall devices fabricated by focused electron-beam-induced deposition
G Boero, I Utke, T Bret, N Quack, M Todorova, S Mouaziz, P Kejik, ...
Applied Physics Letters 86 (4), 042503, 2005
1252005
Focused-electron-beam-induced deposition of freestanding three-dimensional nanostructures of pure coalesced copper crystals
I Utke, A Luisier, P Hoffmann, D Laub, PA Buffat
Applied Physics Letters 81 (17), 3245-3247, 2002
1122002
Gold elliptical nanoantennas as probes for near field optical microscopy
O Sqalli, I Utke, P Hoffmann, F Marquis-Weible
Journal of applied physics 92 (2), 1078-1083, 2002
942002
Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold
T Brintlinger, MS Fuhrer, J Melngailis, I Utke, T Bret, A Perentes, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005
932005
Granular Co–C nano-Hall sensors by focused-beam-induced deposition
M Gabureac, L Bernau, I Utke, G Boero
Nanotechnology 21 (11), 115503, 2010
922010
Cross Section Investigations of Compositions and Sub‐Structures of Tips Obtained by Focused Electron Beam Induced Deposition
I Utke, J Michler, P Gasser, C Santschi, D Laub, M Cantoni, PA Buffat, ...
Advanced Engineering Materials 7 (5), 323-331, 2005
842005
Optimized molecule supply from nozzle-based gas injection systems for focused electron-and ion-beam induced deposition and etching: simulation and experiment
V Friedli, I Utke
Journal of Physics D: Applied Physics 42 (12), 125305, 2009
782009
Small, minimally invasive, direct: electrons induce local reactions of adsorbed functional molecules on the nanoscale
I Utke, A Gölzhäuser
Angewandte Chemie International Edition 49 (49), 9328-9330, 2010
742010
Resolution in focused electron-and ion-beam induced processing
I Utke, V Friedli, M Purrucker, J Michler
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007
732007
Thermal effects during focused electron beam induced deposition of nanocomposite magnetic-cobalt-containing tips
I Utke, T Bret, D Laub, P Buffat, L Scandella, P Hoffmann
Microelectronic engineering 73, 553-558, 2004
722004
Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties
R Raghavan, M Bechelany, M Parlinska, D Frey, WM Mook, A Beyer, ...
Applied Physics Letters 100 (19), 191912, 2012
692012
In situ control of the focused-electron-beam-induced deposition process
T Bret, I Utke, A Bachmann, P Hoffmann
Applied physics letters 83 (19), 4005-4007, 2003
672003
Electron beam induced deposition of metallic tips and wires for microelectronics applications
I Utke, B Dwir, K Leifer, F Cicoira, P Doppelt, P Hoffmann, E Kapon
Microelectronic Engineering 53 (1-4), 261-264, 2000
632000
Tunable nanosynthesis of composite materials by electron‐impact reaction
L Bernau, M Gabureac, R Erni, I Utke
Angewandte Chemie 122 (47), 9064-9068, 2010
622010
Characterization of focused electron beam induced carbon deposits from organic precursors
T Bret, S Mauron, I Utke, P Hoffmann
Microelectronic engineering 78, 300-306, 2005
622005
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