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Tomasz Bieniek
Tomasz Bieniek
Instytut Technologii Elektronowej
Подтвержден адрес электронной почты в домене ite.waw.pl
Название
Процитировано
Процитировано
Год
Design, modeling and simulation of MEMS devices on Si, SiC, and diamond for harsh environment applications
A Kociubiński, T Bieniek, G Janczyk
Acta Physica Polonica A 125 (6), 1374-1376, 2014
172014
Reliability of sputtered thin aluminium films under accelerated stress testing by vibration loading and modeling
B Wunderle, T Onken, J Heilmann, D Silbernagl, J Arnold, T Bieniek, ...
2016 6th Electronic System-Integration Technology Conference (ESTC), 1-14, 2016
152016
MEMS Product Engineering: Handling the Diversity of an Emerging Technology. Best Practices for Cooperative Development
D Ortloff, T Schmidt, K Hahn, T Bieniek, G Janczyk, R Brück
Springer Science & Business Media, 2013
152013
The first and european sic eigth inches pilot line reaction project as a driver for key european sic technologies focused on power electronics development
T Bieniek, G Janczyk, A Sitnik, AA Messina
TechConnect Briefs, 256-259, 2019
112019
Fabrication of high aspect ratio microtube arrays for 2D photonic crystals
C Kraeh, A Popsecu, M Schieber, H Hedler, T Bieniek, G Wielgoszewski, ...
Materials Research Express 1 (2), 026201, 2014
112014
Customer-oriented product engineering of micro and nano devices
T Bieniek, G Janczyk, P Grabiec, J Szynka, S Kaliciński, P Janus, ...
Proceedings of the 17th International Conference Mixed Design of Integrated …, 2010
112010
Multi-Domain Modeling and Simulations of the Heterogeneous Systems
T Pieniek, G Janczyk, P Janusz, J Szynka, P Grabiec, A Kociubiński, ...
Journal of Telecommunications and Information Technology, 34-39, 2010
102010
High cycle fatigue testing and modelling of sputtered aluminium thin films on vibrating silicon MEMS cantilevers
T Onken, J Heilmann, T Bieniek, R Pufall, B Wunderle
2016 17th International Conference on Thermal, Mechanical and Multi-Physics …, 2016
92016
Modeling, simulation and calibration of silicon wet etching
A Kociubiński, M Duk, T Bieniek, P Janus
Journal of Telecommunications and Information Technology, 65-70, 2009
92009
Investigation on reliability of interconnects in 3D heterogeneous systems by ageing beam resonance method
G Janczyk, T Bieniek, J Wasowski, P Grabiec
Microelectronics Journal 45 (7), 981-987, 2014
82014
MEMS product engineering
D Ortloff, T Schmidt, K Hahn, T Bieniek, G Janczyk, R Brück, D Ortloff, ...
MEMS Product Engineering: Handling the Diversity of an Emerging Technology …, 2014
82014
MEMS product engineering
D Ortloff, T Schmidt, K Hahn, T Bieniek, G Janczyk, R Brück, D Ortloff, ...
MEMS Product Engineering: Handling the Diversity of an Emerging Technology …, 2014
82014
Dedicated MEMS-based test structure for 3D SiP interconnects reliability investigation
T Bieniek, G Janczyk, R Dobrowolski, D Szmigiel, M Ekwińska, P Grabiec, ...
2013 IEEE International 3D Systems Integration Conference (3DIC), 1-6, 2013
82013
Efficient scenarios, methodology and tools for MEMS/NEMS product development
T Bieniek, G Janczyk, P Janus, M Ekwińska, D Szmigiel, K Domański, ...
Proceedings of the 10th international conference on multi-material micro …, 2013
72013
Integrated multi-domain modeling and simulation of complex 3D micro-and nanostructures
T Bieniek, G Janczyk, P Janus, A Kociubinski, P Grabiec, J Szynka
2nd European Conference & Exhibition on Integration Issues of Miniaturized …, 2008
72008
Modeling and Co-Simulation of Integrated Microand Nanosystems
P Janus, T Bieniek, A Kociubinski, P Grabiec, G Schopfer
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
72007
Silicon nanowires reliability and robustness investigation using AFM-based techniques
T Bieniek, G Janczyk, P Janus, P Grabiec, M Nieprzecki, G Wielgoszewski, ...
Electron Technology Conference 2013 8902, 654-659, 2013
62013
Optimization on MEMS-IC SiP development reliable design methods
G Janczyk, T Bieniek, P Grabiec, A Wymysłowski, R Swierczyński
Third IEEE International Workshop on Testing Three-Dimensional Stacked …, 2012
62012
Determination of electrical and mechanical parameters in capacitive MEMS accelerometers using electrical measurements
S Kaliciński, T Bieniek, P Janus, P Grabiec
Microelectronics Reliability 51 (7), 1192-1197, 2011
62011
Implementation of fd soi cmos technology in ite
C RENAUX, A CRAHAY, M GRODNER, A PANAS, A SIERAKOWSKI, ...
Elektronika, 13, 2011
62011
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