Підписатись
Neimash
Neimash
Institute of Physics of National Academy of Science of Ukraine
Немає підтвердженої електронної адреси - Домашня сторінка
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Посилання
Рік
Tin doping of silicon for controlling oxygen precipitation and radiation hardness
C Claeys, E Simoen, VB Neimash, A Kraitchinskii, M Kras’ko, O Puzenko, ...
Journal of The Electrochemical Society 148 (12), G738, 2001
542001
Tin induced a-Si crystallization in thin films of Si-Sn alloys
V Neimash, V Poroshin, P Shepeliavyi, V Yukhymchuk, V Melnyk, ...
Journal of Applied Physics 114 (21), 2013
472013
Deep levels in high-energy proton-irradiated tin-doped n-type Czochralski silicon
E Simoen, C Claeys, VB Neimash, A Kraitchinskii, N Krasko, O Puzenko, ...
Applied Physics Letters 76 (20), 2838-2840, 2000
362000
The effect of Sn impurity on the optical and structural properties of thin silicon films
VV Voitovych, VB Neimash, NN Krasko, AG Kolosiuk, VY Povarchuk, ...
Semiconductors 45, 1281-1285, 2011
332011
Influence of tin impurities on the generation and annealing of thermal oxygen donors in Czochralski silicon at 450 C
VB Neimash, A Kraitchinskii, M Kras' ko, O Puzenko, C Claeys, E Simoen, ...
Journal of the Electrochemical Society 147 (7), 2727, 2000
302000
Electrically active defects in irradiated n-type Czochralski silicon doped with group IV impurities
ML David, E Simoen, C Claeys, V Neimash, M Kras’ko, A Kraitchinskii, ...
Journal of Physics: Condensed Matter 17 (22), S2255, 2005
292005
Microstructure of thin Si–Sn composite films
VB Neimash, VM Poroshin, AM Kabaldin, VO Yukhymchuk, ...
Ukrainian journal of physics 58 (9), 865-865, 2013
272013
Exciton-enhanced recombination in silicon at high concentrations of charge carriers
AV Sachenko, AP Gorban, VP Kostylyov
Semiconductor Physics Quantum Electronics & Optoelectronics, 2000
272000
Self-sustained cyclic tin induced crystallization of amorphous silicon
VB Neimash, AO Goushcha, PY Shepeliavyi, VO Yukhymchuk, VA Danko, ...
Journal of Materials Research 30 (20), 3116-3124, 2015
242015
Mechanism of tin-induced crystallization in amorphous silicon
VB Neimash, AO Goushcha, PE Shepeliavyi, VO Yukhymchuk, ...
Ukrainian journal of physics 59 (12), 1168-1168, 2014
242014
Nanocrystals growth control during laser annealing of Sn:(α-Si) composites
V Neimash, P Shepelyavyi, G Dovbeshko, AO Goushcha, M Isaiev, ...
Journal of Nanomaterials 2016, 2016
192016
DLTS Studies of high‐temperature electron irradiated Cz n‐Si
V Neimash, M Kras' ko, A Kraitchinskii, V Voytovych, V Tishchenko, ...
physica status solidi (a) 201 (3), 509-516, 2004
172004
A protective role of HSP90 chaperone in gamma-irradiated Arabidopsis thaliana seeds
L Kozeko, O Talalaiev, V Neimash, V Povarchuk
Life sciences in space research 6, 51-58, 2015
162015
Formation of radiation-induced defects in n-Si with lead and carbon impurities
VB Neimash, VV Voitovych, MM Kras' ko, AM Kraitchinskii, OM Kabaldin, ...
Ukrayins' kij Fyizichnij Zhurnal (Kiev) 50 (11), 1273-1277, 2005
132005
Deep levels in high-temperature 1 MeV electron-irradiated n-type Czochralski silicon
E Simoen, JM Rafí, C Claeys, V Neimash, A Kraitchinskii, M Kras' ko, ...
Japanese journal of applied physics 42 (12R), 7184, 2003
132003
FORMATION OF DEFECTS AS A RESULT OF ELECTRON-IRRADIATION OF TIN-DOPED P-TYPE SILICON
VB Neimash, MG Sosnin, BM Turovskii, VI Shakhovtsov, VL Shindich
SOVIET PHYSICS SEMICONDUCTORS-USSR 16 (5), 577-579, 1982
131982
Influence of doping by the isovalent lead impurity on the parameters of n-silicon
VB Neimash, VV Voitovych, AM Kraitchinskii, LI Shpinar, MM Kras' ko, ...
Ukr. J. Phys 50 (5), 492-496, 2005
122005
Role of laser power, wavelength, and pulse duration in laser assisted tin-induced crystallization of amorphous silicon
VB Neimash, AO Goushcha, LL Fedorenko, PY Shepelyavyi, VV Strelchuk, ...
Journal of Nanomaterials 2018, 1-11, 2018
92018
Mechanical and thermal characteristics of irradiation cross-linked hydrogels
O Nadtoka, N Kutsevol, A Onanko, V Neimash
Nanochemistry, Biotechnology, Nanomaterials, and Their Applications …, 2018
72018
On the effect of lead on irradiation induced defects in silicon
ML David, E Simoen, C Claeys, VB Neimash, M Kras' ko, A Kraitchinskii, ...
Solid State Phenomena 108, 373-378, 2005
72005
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