Íàçâà | Àâòîð | Ïîñèëàííÿ |
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1383 | ||
1078 | ||
V Huard, M Denais, C Parthasarathy - Microelectronics Reliability, 2006 | Íåìຠïðîô³ë³â | 414 |
G Piazza, PJ Stephanou, AP Pisano - Journal of …, 2006 | 412 | |
HB Fang, JQ Liu, ZY Xu, L Dong, L Wang… - Microelectronics …, 2006 | Íåìຠïðîô³ë³â | 401 |
T Umeda, H Yoshida, S Sekine, Y Fujita… - IEEE Journal of Solid …, 2006 | Íåìຠïðîô³ë³â | 399 |
Q Zhang, W Zhao, A Seabaugh - IEEE Electron Device Letters, 2006 | 393 | |
B Razavi - IEEE Journal of Solid-State Circuits, 2006 | Íåìຠïðîô³ëþ | 392 |
356 | ||
T Bryllert, LE Wernersson, LE Froberg… - IEEE Electron Device …, 2006 | 355 |
Äàòè é ê³ëüê³ñòü öèòóâàíü º ïðèáëèçíèìè. Âîíè âèçíà÷àþòüñÿ àâòîìàòè÷íî êîìï’þòåðíîþ ïðîãðàìîþ.